Morphology and properties of poly(oxymethylene) engineering plastics

Comparative WAXD/SAXS/SEM/DSC structural studies of a series of semi-crystalline poly(oxymethylene) (POM) engineering plastics, including the commercial products, homopolymer Delrin(R) and typical poly(oxymethylene-cooxyethylene)s, and a few lab-made POM compositions, were performed. The latter differed in their content of functional additives (present in low concentrations) and POM molecular weight characteristics. In parallel, their densities, thermal behavior/laser-interferometric creep rate spectra (DSC/CRS) at 20-180 degreesC, as well as long-term creep resistance (LTCR) at 20 degreesC were studied. It has been found that introducing the nucleating agents and oxyethylene units resulted in formation of more fine spherulitic or practically non-spherulitic structure with close- or loose-packed lamellar stacks. The presence of both "thick" (5-10 nm) and "thin" (1.5-3 nm) lamellae in the weight ratio of similar to3:1 was shown in all cases. Close values of real POM crystallinities, not exceeding 50%, were obtained by WAXD and DSC. A predominant role of "straightened out" or slightly bent tie chains in disordered layers of isotropic POMs was presumed, resulting in segmental dynamics differently constrained by crystallites (DSC/CRS data). As a result, certain morphology -density -creep resistance correlations were found.