Corrosion-Based Failure of Oxide-Aperture VCSELs

被引:20
作者
Herrick, Robert W. [1 ]
Dafinca, Alexandru [2 ]
Farthouat, Philippe [3 ]
Grillo, Alexander A. [4 ]
McMahon, Stephen J. [5 ]
Weidberg, Anthony R. [2 ]
机构
[1] Intel Corp, Dept Qual & Reliabil, Santa Clara, CA 95054 USA
[2] Univ Oxford, Dept Phys, Oxford OX1 2JD, England
[3] CERN, Dept Phys, CH-1217 Geneva, Switzerland
[4] Univ Calif, Dept Phys, Santa Clara, CA 94720 USA
[5] Rutherford Appleton Lab, Particle Phys Dept, Didcot SN2 1SZ, Oxon, England
关键词
Laser reliability; laser degradation; oxide VCSEL; corrosion; aging; TEM; RELIABILITY; HUMIDITY;
D O I
10.1109/JQE.2013.2285572
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Oxide vertical cavity surface emitting lasers (VCSELs) have been known to have a premature failure mode when operated in the presence of atmospheric water vapor, due to corrosion failure. However, information on the precise chain of failure has not previously been available. In this paper, we start by showing the field failure results in a large particle-physics application with 6,000 deployed channels. Next, evidence is shown for the chain of failure between the previously observed oxide aperture tip cracking and delamination, and how that appears to cause dark-line defect networks in the GaAs active region beneath the aperture. In addition, we show how corrosion can be monitored through spectral width narrowing and discuss other symptoms of corrosion-based degradation that show up hundreds or thousands of hours before the rapid failure takes place. Finally, possible ways of preventing corrosion-based failure are discussed.
引用
收藏
页码:1045 / 1052
页数:8
相关论文
共 25 条
[1]  
[Anonymous], 2013, ATLAS EXPT
[2]  
Cheng YM, 1996, 1996 IEEE INTERNATIONAL RELIABILITY PHYSICS PROCEEDINGS, 34TH ANNUAL, P211, DOI 10.1109/RELPHY.1996.492121
[3]  
Choquette K. D., 1996, P 1996 9 ANN M IEEE, P390
[4]   Advances in selective wet oxidation of AlGaAs alloys [J].
Choquette, KD ;
Geib, KM ;
Ashby, CIH ;
Twesten, RD ;
Blum, O ;
Hou, HQ ;
Follstaedt, DM ;
Hammons, BE ;
Mathes, D ;
Hull, R .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 1997, 3 (03) :916-926
[5]  
Dafinca A., 2013, P SPIE, V8639
[6]  
DeBrabander G. N., 2006, U.S. Patent, Patent No. [7 011 979, 7011979]
[7]  
GIBONEY K, 2002, Patent No. 6351027
[8]   Reliability of oxide VCSELs at emcore [J].
Helms, C ;
Aeby, I ;
Luo, W ;
Herrick, RW ;
Yuen, A .
VERTICAL-CAVITY SURFACE-EMITTING LASERS VIII, 2004, 5364 :183-189
[9]  
Herrick R., 1997, THESIS UCSB SANTA BA
[10]  
Herrick R. W., 2001, UNPUB