The Measurement System for the Calibration of Particle Counters

被引：0

作者：

Sramek, Jan ^{[1
,2
]}

Sperka, Jiri ^{[2
]}

Jankovych, Robert ^{[1
]}

机构：

[1] Brno Univ Technol, Tech 2896 2, Brno 61669, Czech Republic

[2] Czech Metrol Inst, Okruzni 31, Brno 63800, Czech Republic

来源：

PROCEEDINGS OF THE 2016 17TH INTERNATIONAL CONFERENCE ON MECHATRONICS - MECHATRONIKA (ME) 2016 | 2016年

关键词：

particle counter; nanoparticles; ISO; 21501; light scattering;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Nowadays, there is a growing trend towards monitoring of the air quality in indoor areas of various laboratories and factories, as well as in outdoor public areas (air hygiene). For this purposes, portable measurement devices particle counters are usually employed. Due to the necessity to ensure adequate metrological traceability of these systems and to meet the ISO 21501 standard, the calibration procedure has to be performed in proper quality.

引用

页码：392 / 396

页数：5

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