Investigation of the degradation of a thin-film hydrogenated amorphous silicon photovoltaic module

被引:21
作者
van Dyk, E. E.
Audouard, A.
Meyer, E. L.
Woolard, C. D.
机构
[1] Nelson Mandela Metropolitan Univ, Dept Phys, ZA-6031 Port Elizabeth, South Africa
[2] Nelson Mandela Metropolitan Univ, Dept Chem, ZA-6031 Port Elizabeth, South Africa
[3] ECAM Lyon, F-69005 Lyon, France
[4] Univ Ft Hare, Ft Hare Inst Technol, Alice, South Africa
基金
新加坡国家研究基金会;
关键词
photovoltaic modules; a-Si : H; EVA encapsulant; degradation; failure analysis;
D O I
10.1016/j.solmat.2006.08.001
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
The degradation of a thin-film hydrogenated single-junction amorphous silicon (a-Si:H) photovoltaic (PV) module has been studied. We investigated the different modes of electrical and physical degradation of a-Si:H PV modules by employing a degradation and failure assessment procedure used in conjunction with analytical techniques, including, scanning electron microscopy (SEM) and thermogravimetry. This paper reveals that due to their thickness, thin films are very sensitive to the type of degradation observed. Moreover, this paper deals with the problems associated with the module encapsulant, poly(ethylene-co-vinylacetate) (EVA). The main objective of this study was to establish the influence of outdoor environmental conditions on the performance of a thin-film PV module comprising a-Si:H single-junction cells. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:167 / 173
页数:7
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