Mechanical spectroscopy of thin layers of PPV polymer on Si substrates

被引:0
|
作者
Nagy, A
Strahl, A
Neuhäuser, H
Schrader, S
Behrens, I
Peiner, E
Schlachetzki, A
机构
[1] Tech Univ Carolo Wilhelmina Braunschweig, Inst Met Phys & Nucl Solid State Phys, Braunschweig, Germany
[2] Univ Potsdam, Dept Condensed Matter Phys, Inst Phys, Potsdam, Germany
[3] Tech Univ Carolo Wilhelmina Braunschweig, Inst Semicond Technol, Braunschweig, Germany
来源
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2004年 / 370卷 / 1-2期
关键词
thin polymer layers; PPV polymer; vibrating reed technique; beta-; delta-; gamma-relaxations; structural transformation;
D O I
10.1016/j.msea.2003.08.082
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The vibrating reed technique with electro "static" excitation and optical detection has been applied to investigate thin layers of poly-phenylene-vinylene, deposited by spin coating onto microfabricated Si cantilevers, during temperature cycling programs between 90 and 540 K at a rate of 1 K/min. From the vibration frequencies the Young's modulus of the film can be estimated to be about 10 MPa at room temperature in the precursor phase (if prepared from a solution in toluene), which increases by conversion to the conjugate bonded polymer to about 50 MPa. The temperature dependence of internal friction reveals the processes of gamma relaxations (crankshaft motion of side branches in the precursor) and P-relaxation (movements of a few monomer blocks in the polymer chain), as well as peaks indicating the structural transformations during conversion, and possibly a glass transition in the amorphous precursor phase. After conversion only the P-relaxation persists. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:311 / 315
页数:5
相关论文
共 50 条
  • [1] Study of PPV polymer layers on Si substrates by mechanical spectroscopy
    Strahl, A.
    Schrader, S.
    Katholy, S.
    Grimm, B.
    Neuhaeuser, H.
    INTERACTION BETWEEN DEFECTS AND ANELASTIC PHENOMENA IN SOLIDS, 2008, 137 : 189 - +
  • [3] Effect of thin HgTe layers on dislocations in HgCdTe layers on Si substrates
    Okamoto, T
    Saito, T
    Murakami, S
    Nishino, H
    Maruyama, K
    Nishijima, Y
    Wada, H
    Nagashima, M
    Nogami, Y
    APPLIED PHYSICS LETTERS, 1996, 69 (05) : 677 - 678
  • [4] Transport features of photogenerated and equilibrium charge carriers in thin PPV polymer layers
    Juska, G
    Genevicius, K
    Viliunas, M
    Arlauskas, K
    Österbacka, R
    Stubb, H
    OPTICAL ORGANIC AND INORGANIC MATERIALS, 2001, 4415 : 145 - 149
  • [5] Growth of GaN on thin Si {111} layers bonded to Si {100} substrates
    Fleming, JG
    Han, J
    III-V AND IV-IV MATERIALS AND PROCESSING CHALLENGES FOR HIGHLY INTEGRATED MICROELECTRONICS AND OPTOELECTRONICS, 1999, 535 : 101 - 106
  • [6] Formation of Palladium Silicide Thin Layers on Si(110) Substrates
    Suryana, Risa
    Nakatsuka, Osamu
    Zaima, Shigeaki
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2011, 50 (05)
  • [7] THE EFFECT OF THIN BUFFER LAYERS ON GAAS HETEROEPITAXY ON SI SUBSTRATES
    ROSNER, SJ
    KOCH, SM
    HARRIS, JS
    JOURNAL OF ELECTRONIC MATERIALS, 1986, 15 (05) : 299 - 299
  • [8] Fabrication of SOI substrates with ultra-thin Si layers
    Hobart, KD
    Kub, FJ
    Jernigan, GG
    Twigg, ME
    Thompson, PE
    ELECTRONICS LETTERS, 1998, 34 (12) : 1265 - 1267
  • [9] Alpha spectroscopy substrates based on thin polymer films
    Joseph M. Mannion
    W. David Locklair
    Brain A. Powell
    Scott M. Husson
    Journal of Radioanalytical and Nuclear Chemistry, 2016, 307 : 2339 - 2345
  • [10] Alpha spectroscopy substrates based on thin polymer films
    Mannion, Joseph M.
    Locklair, W. David
    Powell, Brain A.
    Husson, Scott M.
    JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY, 2016, 307 (03) : 2339 - 2345