Evaluation of electron tomography reconstruction methods for interface roughness measurement

被引:5
作者
Hayashida, Misa [1 ]
Ogawa, Shinichi [2 ]
Malac, Marek [1 ,3 ]
机构
[1] CNR, Nanotechnol Res Ctr, Edmonton, AB T6G 2M9, Canada
[2] Natl Inst Adv Ind Sci & Technol, Nanoelect Res Inst, Tsukuba, Ibaraki 3058569, Japan
[3] Univ Alberta, Dept Phys, Edmonton, AB T6G 2E1, Canada
关键词
buried interface roughness; dose fractionation theorem; electron tomography; radiation damage; semiconductor devices; ART; MICROSCOPY;
D O I
10.1002/jemt.23006
中图分类号
R602 [外科病理学、解剖学]; R32 [人体形态学];
学科分类号
100101 ;
摘要
We evaluate the suitability of simultaneous iterative reconstruction technique (SIRT), filtered back projection, and simultaneous algebraic reconstruction technique methods for buried interface roughness measurements. We also investigate the effect of total electron dose distributed over the entire tilt series on measured roughness values. We investigate the applicability of the dose fractionation theorem by evaluating the effect of an increasing number of images, i.e., decreasing tilt increment size at fixed total electron irradiation dose on the quantitative measurement of buried interface roughness. The results indicate that SIRT is the most suitable method for reconstruction and a 3 degrees to 5 degrees angle is optimal for the roughness measurement.
引用
收藏
页码:515 / 519
页数:5
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