Scanning Tunneling Spectroscopy

被引:71
作者
Zandvliet, Harold J. W. [1 ]
van Houselt, Arie [1 ]
机构
[1] Univ Twente, Phys Aspects Nanoelect & MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands
关键词
scanning probe microscopy; surfaces; single-electron tunneling; thermodynamics; FLIP-FLOP MOTION; SI AD-DIMERS; BUCKLED DIMERS; MICROSCOPY; SURFACE; ELECTRODES; MOLECULE; CONFINEMENT; ENERGETICS; DYNAMICS;
D O I
10.1146/annurev-anchem-060908-155213
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The scanning tunneling microscope (STM) has revolutionized our ability to explore and manipulate atomic-scale solid surfaces. In addition to its unparalleled spatial power, the STM can study dynamical processes, such as molecular conformational changes, by recording current traces as a function of time. It can also be employed to measure the physical properties of molecules or nanostructures down to the atomic scale. Combining STM imaging with measurement of current-voltage (1-V) characteristics [i.e., scanning tunneling spectroscopy (STS)] at similar resolution mikes it possible to obtain a detailed map of the electronic structure of a surface. For many years, STM lacked chemical specificity; however, the recent development of STM-IETS (inelastic electron tunneling spectroscopy) has allowed LIS to measure the vibrational spectrum of a single molecule. This review introduces and illustrates these recent developments with a few simple scholarly examples.
引用
收藏
页码:37 / 55
页数:19
相关论文
共 50 条
  • [41] Renormalization of the Graphene Dispersion Velocity Determined from Scanning Tunneling Spectroscopy
    Chae, Jungseok
    Jung, Suyong
    Young, Andrea F.
    Dean, Cory R.
    Wang, Lei
    Gao, Yuanda
    Watanabe, Kenji
    Taniguchi, Takashi
    Hone, James
    Shepard, Kenneth L.
    Kim, Phillip
    Zhitenev, Nikolai B.
    Stroscio, Joseph A.
    PHYSICAL REVIEW LETTERS, 2012, 109 (11)
  • [42] Combined I(V) and dI(V)/dz scanning tunneling spectroscopy
    Castenmiller, Carolien
    van Bremen, Rik
    Sotthewes, Kai
    Siekman, Martin H.
    Zandvliet, Harold J. W.
    AIP ADVANCES, 2018, 8 (07):
  • [43] Electronic and magnetic properties of bulk Cr tips for scanning tunneling spectroscopy
    Donati, F.
    Fratesi, G.
    Ning, L.
    Brambilla, A.
    Trioni, M. I.
    Bassi, A. Li
    Casari, C. S.
    Passoni, M.
    PHYSICAL REVIEW B, 2013, 87 (23)
  • [44] Electronic Structure of G4-DNA by Scanning Tunneling Spectroscopy
    Shapir, Errez
    Sagiv, Lior
    Molotsky, Tatiana
    Kotlyar, Alexander B.
    Di Felice, Rosa
    Porath, Danny
    JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (50) : 22079 - 22084
  • [45] Three-dimensional scanning force/tunneling spectroscopy at room temperature
    Sugimoto, Yoshiaki
    Ueda, Keiichi
    Abe, Masayuki
    Morita, Seizo
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2012, 24 (08)
  • [46] Note: Fabrication and characterization of molybdenum tips for scanning tunneling microscopy and spectroscopy
    Carrozzo, P.
    Tumino, F.
    Facibeni, A.
    Passoni, M.
    Casari, C. S.
    Bassi, A. Li
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2015, 86 (01)
  • [47] Single Si dopants in GaAs studied by scanning tunneling microscopy and spectroscopy
    Wijnheijmer, A. P.
    Garleff, J. K.
    Teichmann, K.
    Wenderoth, M.
    Loth, S.
    Koenraad, P. M.
    PHYSICAL REVIEW B, 2011, 84 (12):
  • [48] Electronic structure of cubic boron arsenide probed by scanning tunneling spectroscopy
    Lee, Hwijong
    Gamage, Geethal Amila
    Lyons, John L.
    Tian, Fei
    Smith, Brandon
    Glaser, Evan R.
    Ren, Zhifeng
    Shi, Li
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2021, 54 (31)
  • [49] Normalization procedure for obtaining the local density of states from high-bias scanning tunneling spectroscopy
    Rejali, Rasa
    Farinacci, Laetitia
    Otte, Sander
    PHYSICAL REVIEW B, 2023, 107 (03)
  • [50] Model-Based Control of the Scanning Tunneling Microscope: Enabling New Modes of Imaging, Spectroscopy, and Lithography
    Alemansour, Hamed
    Moheimani, S. O. Reza
    IEEE CONTROL SYSTEMS MAGAZINE, 2024, 44 (01): : 46 - 66