Scanning Tunneling Spectroscopy

被引:71
作者
Zandvliet, Harold J. W. [1 ]
van Houselt, Arie [1 ]
机构
[1] Univ Twente, Phys Aspects Nanoelect & MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands
关键词
scanning probe microscopy; surfaces; single-electron tunneling; thermodynamics; FLIP-FLOP MOTION; SI AD-DIMERS; BUCKLED DIMERS; MICROSCOPY; SURFACE; ELECTRODES; MOLECULE; CONFINEMENT; ENERGETICS; DYNAMICS;
D O I
10.1146/annurev-anchem-060908-155213
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The scanning tunneling microscope (STM) has revolutionized our ability to explore and manipulate atomic-scale solid surfaces. In addition to its unparalleled spatial power, the STM can study dynamical processes, such as molecular conformational changes, by recording current traces as a function of time. It can also be employed to measure the physical properties of molecules or nanostructures down to the atomic scale. Combining STM imaging with measurement of current-voltage (1-V) characteristics [i.e., scanning tunneling spectroscopy (STS)] at similar resolution mikes it possible to obtain a detailed map of the electronic structure of a surface. For many years, STM lacked chemical specificity; however, the recent development of STM-IETS (inelastic electron tunneling spectroscopy) has allowed LIS to measure the vibrational spectrum of a single molecule. This review introduces and illustrates these recent developments with a few simple scholarly examples.
引用
收藏
页码:37 / 55
页数:19
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