Phase transitions and the temperature dependence of the dielectric properties in tetragonally strained barium strontium titanate films

被引：10
作者：
Alldredge, L. M. B. [1 ]
Chang, Wontae [1 ]
Kirchoefer, Steven W. [1 ]
Pond, Jeffrey M. [1 ]
机构：
[1] USN, Res Lab, Washington, DC 20375 USA
来源：
APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 05期
关键词：
barium compounds; dielectric thin films; ferroelectric transitions; magnesium compounds; permittivity; sputter deposition; strontium compounds; tensile strength; FERROELECTRIC THIN-FILMS; CONSTANT; DIAGRAMS;
D O I：
10.1063/1.3079093
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The dielectric properties of sputter-deposited Ba(1-x)Sr(x)TiO(3) (BST) thin films on (001) MgO substrates with in-plane or out-of-plane tetragonal lattice structure distortions were characterized as a function of temperature. A temperature-dependent interpolation calibration technique was developed for increased efficiency of the microwave measurements. The BST films showed significant differences in the ferroelectric phase transition due to lattice distortions with a strong temperature dependence of the in-plane dielectric behavior for films under tensile strain and a weak temperature dependence for films under compressive strain. The experimental data agreed well with theoretical modeling of the BST film strain effect based on Devonshire's theory.
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页数：3
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