Phase contrast X-ray imaging

被引：34

作者：

Weon, Byung Mook

Je, Jung Ho ^{[1
]}

Hwu, Yeukuang

Margaritondo, Giorgio

机构：

[1] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Biomed Imaging Ctr, I BIO Program, Pohang 790784, South Korea

[2] Acad Sinica, Inst Phys, Taipei 11529, Taiwan

[3] Ecole Polytech Fed Lausanne, Inst Phys Nanostruct, CH-1015 Lausanne, Switzerland

来源：

INTERNATIONAL JOURNAL OF NANOTECHNOLOGY | 2006年 / 3卷 / 2-3期

关键词：

X-ray imaging; phase contrast; hard X-ray; unmonochromatic beam; microradiology; microtomography; nanoradiology;

D O I：

10.1504/IJNT.2006.009584

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In the last decade X-ray imaging based on phase contrast greatly advanced thanks to the use of unmonochromatic synchrotron hard X-rays. The recent advances are going beyond microradiology and microtomography to reach nanometre scale. This paper reviews basic theory and selected applications to biomedical and materials sciences. The forthcoming improvements in phase contrast X-ray imaging will lead to even better imaging of many different phenomena at nanometre level.

引用

页码：280 / 297

页数：18

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