An Intuitive Analysis of Phase Noise Fundamental Limits Suitable for Benchmarking LC Oscillators

被引：67
作者：
Garampazzi, Marco [1 ]
Dal Toso, Stefano [2 ]
Liscidini, Antonio [3 ]
Manstretta, Danilo [1 ]
Mendez, P. [4 ]
Romano, L. [2 ]
Castello, Rinaldo [1 ]
机构：
[1] Univ Pavia, I-27100 Pavia, Italy
[2] Marvell, Pavia, Italy
[3] Univ Toronto, Edward S Rogers Sr Dept Elect & Comp Engn, Toronto, ON, Canada
[4] Univ Minho, Guimaraes, Portugal
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 2014年 / 49卷 / 03期
关键词：
Class-B; class-C; class-F; CMOS integrated circuits; excess noise factor (ENF); figure of merit (FoM); GSM; impulse sensitivity function; low-noise; phase noise; radio frequency integrated circuits; voltage controlled oscillators; wide tuning range oscillators; CMOS VCOS; BAND VCO; RF CMOS; TANK; PERFORMANCE; FREQUENCY; SPECTRUM; COLPITTS; DESIGN;
D O I：
10.1109/JSSC.2014.2301760
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An intuitive yet sufficiently accurate formulation of the phase noise of various commonly used oscillators, including most types of class-B (standard, AC-coupled and with tail filter) and class-C, is derived and used to compare their fundamental limitations. A noise factor that represents the difference between the maximum achievable Figure of Merit and the actual one is derived for all topologies considered. Measurements on a dedicated chip prototype that integrates two high performance topologies allow to verify, in an unbiased way, the accuracy of the predictions. A very good agreement between the model and both simulation and measurement is obtained.
引用
收藏
页码：635 / 645
页数：11
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