A Study on the Radiated Susceptibility of Printed Circuit Boards and the Effects of Via Fencing

被引:4
作者
Tortorich, Ryan P. [1 ,2 ]
Morell, William [2 ]
Reiner, Elizabeth [2 ]
Bouillon, William [2 ]
Choi, Jin-Woo [1 ]
机构
[1] Louisiana State Univ, Sch Elect Engn & Comp Sci, Baton Rouge, LA 70803 USA
[2] Radiance Technol, Huntsville, AL 35806 USA
关键词
backdoor coupling; full wave modeling; high intensity radiated fields (HIRF); induced voltage; parallel plate resonance; printed circuit board (PCB) coupling; radiated susceptibility; via fencing; via stitching; ELECTROMAGNETIC-FIELD; SYSTEMS;
D O I
10.3390/electronics10050539
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Because modern electronic systems are likely to be exposed to high intensity radiated fields (HIRF) environments, there is growing interest in understanding how electronic systems are affected by such environments. Backdoor coupling in particular is an area of concern for all electronics, but there is limited understanding about the mechanisms behind backdoor coupling. In this work, we present a study on printed circuit board (PCB) backdoor coupling and the effects of via fencing. Existing work focuses on ideal stackups and indicates that edge radiation is significantly reduced by via fencing. In this study, both full wave electromagnetic modeling and experimental verification are used to investigate both ideal and practical PCB stackups. In the ideal scenario, we find that via fencing substantially reduces coupling, which is consistent with prior work on emissions. In the practical scenario, we incorporate component footprints and traces which naturally introduce openings in the top ground plane. Both simulation and experimental data indicate that via fencing in the practical scenario does not substantially mitigate coupling, suggesting that PCB edge coupling is not the dominant coupling mechanism, even at varying angles of incidence and polarization.
引用
收藏
页码:1 / 17
页数:17
相关论文
共 49 条
[1]  
Abadpour S., 2011, Proceedings of the 2011 International Conference on Electromagnetics in Advanced Applications & IEEE-APS Topical Conference on Antennas & Propagation in Wireless Communications (ICEAA 2011), P741, DOI 10.1109/ICEAA.2011.6046437
[2]  
Anupama V, 2013, 2013 INTERNATIONAL CONFERENCE ON EMERGING TRENDS IN VLSI, EMBEDDED SYSTEM, NANO ELECTRONICS AND TELECOMMUNICATION SYSTEM (ICEVENT 2013)
[3]   Susceptibility of electronic systems to high-power microwaves:: Summary of test experience [J].
Bäckström, MG ;
Lövstrand, KG .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2004, 46 (03) :396-403
[4]  
Bai Y.W., 2013, P 2013 IEEE INT S IN, DOI [10.1109/ISIE.2013.6563820, DOI 10.1109/ISIE.2013.6563820]
[5]   TRANSIENT-RESPONSE OF A MICROSTRIP LINE CIRCUIT EXCITED BY AN EXTERNAL ELECTROMAGNETIC SOURCE [J].
BERNARDI, P ;
CICCHETTI, R ;
PIRONE, C .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 1992, 34 (02) :100-108
[6]   RESPONSE OF A PLANAR MICROSTRIP LINE EXCITED BY AN EXTERNAL ELECTROMAGNETIC-FIELD [J].
BERNARDI, P ;
CICCHETTI, R .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 1990, 32 (02) :98-105
[7]  
Cao Y.S., 2018, P 2018 IEEE S EL COM, P269, DOI [10.1109/EMCSI.2018.8495380, DOI 10.1109/EMCSI.2018.8495380]
[8]   Analytical model for the rectangular power-ground structure including radiation loss [J].
Chen, RL ;
Chen, J ;
Hubing, TH ;
Shi, WM .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2005, 47 (01) :10-16
[9]  
Chiappe J, 2015, 2015 IEEE SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND SIGNAL INTEGRITY, P101, DOI 10.1109/EMCSI.2015.7107667
[10]  
Du J.K., 2012, P IEEE MTT S INT MIC, P1, DOI [10.1109/MWSYM.2012.6259460, DOI 10.1109/MWSYM.2012.6259460]