Photo double detachment of CN-:: Electronic decay from an inner-valence hole in molecular anions

被引:10
作者
Bilodeau, R. C. [1 ]
Walter, C. W.
Dumitriu, I.
Gibson, N. D.
Ackerman, G. D.
Bozek, J. D.
Rude, B. S.
Santra, R.
Cederbaum, L. S.
Berrah, N.
机构
[1] Western Michigan Univ, Dept Phys, Kalamazoo, MI 49008 USA
[2] Lawrence Berkeley Lab, Berkeley, CA 94720 USA
[3] Denison Univ, Dept Phys & Astron, Granville, OH 43023 USA
[4] Argonne Natl Lab, Argonne, IL 60439 USA
[5] Harvard Smithsonian Ctr Astrophys, ITAMP, Cambridge, MA 02138 USA
[6] Heidelberg Univ, Inst Chem Phys, D-69120 Heidelberg, Germany
基金
美国国家科学基金会;
关键词
D O I
10.1016/j.cplett.2006.05.127
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The first measurements of inner-valence photodetachment from a molecular negative ion are presented. Experimental and theoretical studies of CN- photodetachment around the 2-electron threshold (25-90 eV) are reported. Included are measured absolute cross sections for CN+ production by photo double detachment of CN-, and for C+ and N+ fragments produced from the dissociation of the excited molecule. The measurements also reveal the signature of inner-valence autoionization, similar to the interatomic Coulombic decay (ICD) phenomenon. This work confirms the predicted effect, which should in general be present for molecular anions, even in very small molecules. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:237 / 241
页数:5
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