Alternating current impedance imaging of high-resistance membrane pores using a scanning electrochemical microscope. Application of membrane electrical shunts to increase measurement sensitivity and image contrast

被引:36
作者
Ervin, Eric Nathan
White, Henry S.
Baker, Lane A.
Martin, Charles R.
机构
[1] Univ Utah, Dept Chem, Salt Lake City, UT 84112 USA
[2] Univ Florida, Ctr Res Bionano Interface, Gainesville, FL 32611 USA
关键词
D O I
10.1021/ac060577k
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Whether an individual pore in a porous membrane can be imaged using scanning electrochemical microscopy (SECM), operated in ac impedance mode, is determined by the magnitude of the change in the total impedance of the imaging system as the SECM tip is scanned over the pore. In instances when the SECM tip resistance is small relative to the internal pore resistance, the total impedance changes by a negligible amount, rendering the pore invisible during impedance imaging. A simple solution to this problem is to introduce a low-impedance electrical shunt (i.e., a salt bridge) across the membrane. This principle is demonstrated by imaging polycarbonate membranes (6-12-mu m thickness) containing between 1 and 2000 conical-shaped pores (60-nm- and 2.5-mu m-diameter openings) using an similar to 1-mu m-radius Pt tip. Theory and experiments show that image contrast ( the change in ac current measured as the probe is scanned over the pore) is inversely proportional to the total resistance of the membrane and can be increased by a factor of similar to 50 x by introducing a low-resistance electrical shunt across the membrane. Remarkably, SECM images of membranes containing a single high-resistance (similar to 1G Omega) pore can only be imaged by short-circuiting the membrane. Image contrast also becomes independent of membrane resistance when an electrical shunt is used, allowing for more quantitative comparisons of the features in ac impedance images of different membranes.
引用
收藏
页码:6535 / 6541
页数:7
相关论文
共 25 条
[1]   Impedance feedback control for scanning electrochemical microscopy [J].
Alpuche-Aviles, MA ;
Wipf, DO .
ANALYTICAL CHEMISTRY, 2001, 73 (20) :4873-4881
[2]   Application of AC impedance techniques to Scanning Electrochemical Microscopy [J].
Baranski, AS ;
Diakowski, PM .
JOURNAL OF SOLID STATE ELECTROCHEMISTRY, 2004, 8 (10) :683-692
[3]  
Bard A.J., 2001, Scanning Electrochemical Microscopy
[4]   Scanning electrochemical microscopy of living cells.: 3.: Rhodobacter sphaeroides [J].
Cai, CX ;
Liu, B ;
Mirkin, MV ;
Frank, HA ;
Rusling, JF .
ANALYTICAL CHEMISTRY, 2002, 74 (01) :114-119
[5]   Alternating current impedance imaging of membrane pores using scanning electrochemical microscopy [J].
Ervin, EN ;
White, HS ;
Baker, LA .
ANALYTICAL CHEMISTRY, 2005, 77 (17) :5564-5569
[6]   High resolution constant-distance mode alternating current scanning electrochemical microscopy (AC-SECM) [J].
Etienne, M ;
Schulte, A ;
Schuhmann, W .
ELECTROCHEMISTRY COMMUNICATIONS, 2004, 6 (03) :288-293
[7]  
Fleischer R. L., 1975, Nuclear tracks in solids: Principles and applications
[8]   Scanning electrochemical microscopy imaging by means of high-frequency impedance measurements in feedback mode [J].
Gabrielli, C ;
Huet, F ;
Keddam, M ;
Rousseau, P ;
Vivier, V .
JOURNAL OF PHYSICAL CHEMISTRY B, 2004, 108 (31) :11620-11626
[9]   Stochastic sensing of organic analytes by a pore-forming protein containing a molecular adapter [J].
Gu, LQ ;
Braha, O ;
Conlan, S ;
Cheley, S ;
Bayley, H .
NATURE, 1999, 398 (6729) :686-690
[10]   PREPARATION OF STM TIPS FOR INSITU CHARACTERIZATION OF ELECTRODE SURFACES [J].
HEBEN, MJ ;
DOVEK, MM ;
LEWIS, NS ;
PENNER, RM ;
QUATE, CF .
JOURNAL OF MICROSCOPY, 1988, 152 :651-661