Nanocathodoluminescence Reveals Mitigation of the Stark Shift in InGaN Quantum Wells by Si Doping

被引:29
作者
Griffiths, James T. [1 ]
Zhang, Siyuan [1 ]
Rouet-Leduc, Bertrand [1 ]
Fu, Wai Yuen [1 ]
Bao, An [1 ]
Zhu, Dandan [1 ,2 ]
Wallis, David J. [1 ,2 ]
Howkins, Ashley [3 ]
Boyd, Ian [3 ]
Stowe, David [4 ]
Kappers, Menno J. [1 ]
Humphreys, Colin J. [1 ]
Oliver, Rachel A. [1 ]
机构
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB3 0FS, England
[2] Plessey Semicond, Plymouth PL6 7BQ, Devon, England
[3] Brunel Univ, Expt Tech Ctr, Uxbridge UB8 3PH, Middx, England
[4] Gatan UK, Abingdon OX14 1RL, Oxon, England
基金
欧洲研究理事会; 英国工程与自然科学研究理事会;
关键词
Nanocathodoluminescence; scanning transmission electron microscopy; InGaN optoelectronics; light emitting diodes; quantum confined Stark effect; silicon doping; OPTICAL-PROPERTIES; DIFFUSION LENGTH; EFFICIENCY; SPECTRA;
D O I
10.1021/acs.nanolett.5b03531
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Nanocathodoluminescence reveals the spectral properties of individual InGaN quantum wells in high efficiency light emitting diodes. We observe a variation in the emission wavelength of each quantum well, in correlation with the Si dopant concentration in the quantum barriers. This is reproduced by band profile simulations, which reveal the reduction of the Stark shift in the quantum wells by Si doping. We demonstrate nanocathodoluminescence is a powerful technique to optimize doping in optoelectronic devices.
引用
收藏
页码:7639 / 7643
页数:5
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