Dimensional artefacts to achieve metrological traceability in advanced manufacturing

被引：62

作者：

Carmignato, S. ^{[1
]}

De Chiffre, L. ^{[2
]}

Bosse, H. ^{[3
]}

Leach, R. K. ^{[4
]}

Balsamo, A. ^{[5
]}

Estler, W. T. ^{[6
]}

机构：

[1] Univ Padua, Padua, Italy

[2] Tech Univ Denmark, Lyngby, Denmark

[3] Phys Tech Bundesanstalt PTB, Braunschweig, Germany

[4] Univ Nottingham, Nottingham, England

[5] Ist Nazl Ric Metrol INRiM, Turin, Italy

[6] NIST, Gaithersburg, MD 20899 USA

来源：

CIRP ANNALS-MANUFACTURING TECHNOLOGY | 2020年 / 69卷 / 02期

关键词：

Manufacturing metrology; Traceability; Dimensional artefacts; RAY COMPUTED-TOMOGRAPHY; LARGE-SCALE-METROLOGY; PERFORMANCE VERIFICATION; UNCERTAINTY EVALUATION; REFERENCE TEMPERATURE; FREEFORM MEASUREMENTS; CALIBRATION ARTIFACT; MEASUREMENT SYSTEM; TURBINE-BLADES; GAUGE BLOCKS;

D O I：

10.1016/j.cirp.2020.05.009

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Dimensional measurements play a central role in enabling advanced manufacturing technologies, enhancing the quality of products and increasing productivity. This role becomes even more important in the context of Industry 4.0, where reliable and accurate digital models of products, processes and production systems are needed. To establish the traceability chain that links measurements in production to the length unit, dimensional artefacts - ranging from measurement standards to calibrated workpieces - are fundamental. The paper examines dimensional artefacts, discussing their characteristics, availability and role in supporting production by establishing metrological traceability, and provides guidelines for their selection, use and development. (C) 2020 CIRP. Published by Elsevier Ltd. All rights reserved.

引用

页码：693 / 716

页数：24

共 296 条

[1] Challenges on double ended gauge block interferometry unveiled by the study of a prototype at PTB [J].