Visible Light Response of Unintentionally Doped ZnO Nanowire Field Effect Transistors

被引:32
作者
Liu, Yang [1 ,2 ]
Zhang, Zhiyong [1 ,2 ]
Xu, Huilong [1 ,2 ]
Zhang, Lihuan [1 ,2 ]
Wang, Zhenxing [1 ,2 ]
Li, Wenliang [1 ,2 ]
Ding, Li [1 ,2 ]
Hu, Youfan [1 ,2 ]
Gao, Min [1 ,2 ]
Li, Quan [3 ]
Peng, Lian-Mao [1 ,2 ]
机构
[1] Peking Univ, Key Lab Phys & Chem Nanodevices, Beijing 100871, Peoples R China
[2] Peking Univ, Dept Elect, Beijing 100871, Peoples R China
[3] Chinese Univ Hong Kong, Dept Phys, Shatin, Hong Kong, Peoples R China
基金
美国国家科学基金会;
关键词
PHOTODETECTORS;
D O I
10.1021/jp9046038
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A significant visible light response of unintentionally doped ZnO nanowire (NW) field effect transistors (FETs) has been observed in a reversible manner (for illumination source on and off). In particular, under white light illumination (wavelength longer than 400 nm), the threshold voltage (V-T) of the ZnO NW FET shifts greatly to the negative direction, suggesting a remarkable increase in carrier concentration. A photon-assisted oxygen molecule desorption mechanism is proposed to explain the observed sub-bandgap photoresponse on the basis of the behavior of the experimental devices in different gas atmospheres (air, vacuum, pure N-2, and pure O-2) and with/without nanowire surface modifications (coated with PMMA).
引用
收藏
页码:16796 / 16801
页数:6
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