Thin-film-growth models:: roughness and correlation functions

Surfaces arising in amorphous thin-film-growth are often described by certain classes of stochastic PDEs. In this paper we address the question of existence of a solution and statistical quantities (e.g. mean interface width or correlation functions). Moreover, we discuss the approximations of such statistical quantities by the spectral Galerkin method. This is an important question, as the numerical computation of statistical quantities plays a key role in the verification of the models.