GaN-based diodes and transistors for chemical, gas, biological and pressure sensing

被引:269
作者
Pearton, SJ [1 ]
Kang, BS
Kim, SK
Ren, F
Gila, BP
Abernathy, CR
Lin, JS
Chu, SNG
机构
[1] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA
[2] Univ Florida, Dept Chem Engn, Gainesville, FL 32611 USA
[3] Univ Florida, Dept Elect Engn, Gainesville, FL 32611 USA
[4] Multiplex Inc, S Plainfield, NJ 07080 USA
关键词
D O I
10.1088/0953-8984/16/29/R02
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
There is renewed emphasis on development of robust solid-state sensors capable of uncooled operation in harsh environments. The sensors should be capable of detecting chemical, gas, biological or radiation releases as well as sending signals to central monitoring locations. We discuss the advances in use of GaN-based solid-state sensors for these applications. AlGaN/GaN high electron mobility transistors (HEMTs) show a strong dependence of source/drain current on the piezoelectric polarization-induced two-dimensional electron gas (2DEG). Furthermore, spontaneous and piezoelectric polarization-induced surface and interface charges can be used to develop very sensitive but robust sensors to detect gases, polar liquids and mechanical pressure. AlGaN/GaN HEMT structures have been demonstrated to exhibit large changes in source-drain current upon exposing the gate region to various block co-polymer solutions. Pt-gated GaN Schottky diodes and Sc2O3/AlGaN/GaN metal-oxide semiconductor diodes also show large change in forward currents upon exposure to H-2. Of particular interest is detection of ethylene (C2H4), which has strong double bonds and hence is difficult to dissociate at modest temperatures. Apart from combustion gas sensing, the AlGaN/GaN heterostructure devices can be used as sensitive detectors of pressure changes. In addition, large changes in source-drain current of the AlGaN/GaN HEMT sensors can be detected upon adsorption of biological species on the semiconductor surface. Finally, the nitrides provide an ideal platform for fabrication of surface acoustic wave (SAW) devices. The GaN-based devices thus appear promising for a wide range of chemical, biological, combustion gas, polar liquid, strain and high temperature pressure-sensing applications. In addition, the sensors are compatible with high bit-rate wireless communication systems that facilitate their use in remote arrays.
引用
收藏
页码:R961 / R994
页数:34
相关论文
共 98 条
  • [81] 2-C
  • [82] pH response of GaN surfaces and its application for pH-sensitive field-effect transistors
    Steinhoff, G
    Hermann, M
    Schaff, WJ
    Eastman, LF
    Stutzmann, M
    Eickhoff, M
    [J]. APPLIED PHYSICS LETTERS, 2003, 83 (01) : 177 - 179
  • [84] GAN, AIN, AND INN - A REVIEW
    STRITE, S
    MORKOC, H
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (04): : 1237 - 1266
  • [85] GaN-based heterostructures for sensor applications
    Stutzmann, M
    Steinhoff, G
    Eickhoff, M
    Ambacher, O
    Nebel, CE
    Schalwig, J
    Neuberger, R
    Müller, G
    [J]. DIAMOND AND RELATED MATERIALS, 2002, 11 (3-6) : 886 - 891
  • [86] A COATED PIEZOELECTRIC CRYSTAL DETECTOR FOR PHOSGENE
    SULEIMAN, A
    GUILBAULT, GG
    [J]. ANALYTICA CHIMICA ACTA, 1984, 162 (AUG) : 97 - 102
  • [87] Influence of catalytic reactivity on the response of metal-oxide-silicon carbide sensor to exhaust gases
    Svenningstorp, H
    Tobias, P
    Lundström, I
    Salomonsson, P
    Mårtensson, P
    Ekedahl, LG
    Spetz, AL
    [J]. SENSORS AND ACTUATORS B-CHEMICAL, 1999, 57 (1-3) : 159 - 165
  • [88] Effect of substrate bias on AlN thin film preparation in shielded reactive vacuum are deposition
    Takikawa, H
    Kimura, K
    Miyano, R
    Sakakibara, T
    Bendavid, A
    Martin, PJ
    Matsumuro, A
    Tsutsumi, K
    [J]. THIN SOLID FILMS, 2001, 386 (02) : 276 - 280
  • [89] Deep reactive ion etching of silicon carbide
    Tanaka, S
    Rajanna, K
    Abe, T
    Esashi, M
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (06): : 2173 - 2176
  • [90] DC and microwave performance of a GaN/AlGaN MOSHFET under high temperature stress
    Tarakji, A
    Hu, X
    Koudymov, A
    Simin, G
    Yang, J
    Khan, MA
    Shur, MS
    Gaska, R
    [J]. SOLID-STATE ELECTRONICS, 2002, 46 (08) : 1211 - 1214