Electric field control of spin re-orientation in perpendicular magnetic tunnel junctions-CoFeB and MgO thickness dependence

被引:10
作者
Meng, Hao [1 ]
Naik, Vinayak Bharat [1 ]
Liu, Ruisheng [1 ]
Han, Guchang [1 ]
机构
[1] ASTAR, Data Storage Inst, Singapore 117608, Singapore
关键词
RANDOM-ACCESS MEMORY; ROOM-TEMPERATURE; VOLTAGE; MAGNETORESISTANCE; ANISOTROPY;
D O I
10.1063/1.4891843
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report an investigation of electric-field (EF) control of spin re-orientation as functions of the thicknesses of CoFeB free layer (FL) and MgO layer in synthetic-antiferromagnetic pinned magnetic tunnel junctions with perpendicular magnetic anisotropy. It is found that the EF modulates the coercivity (Hc) of the FL almost linearly for all FL thicknesses, while the EF efficiency, i.e., the slope of the linearity, increases as the FL thickness increases. This linear variation in Hc is also observed for larger MgO thicknesses (>= 1.5 nm), while the EF efficiency increases only slightly from 370 to 410 Oe nm/V when MgO thickness increases from 1.5 to 1.76 nm. We have further observed the absence of quasi-DC unipolar switching. We discuss its origin and highlight the underlying challenges to implement the EF controlled switching in a practical magnetic memory. (C) 2014 AIP Publishing LLC.
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页数:5
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