Image-based bidirectional reflectance distribution function measurement

被引：130

作者：

Marschner, SR ^{[1
]}

Westin, SH ^{[1
]}

Lafortune, EPF ^{[1
]}

Torrance, KE ^{[1
]}

机构：

[1] Cornell Univ, Program Comp Graph, Ithaca, NY 14853 USA

来源：

APPLIED OPTICS | 2000年 / 39卷 / 16期

关键词：

D O I：

10.1364/AO.39.002592

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a new image-based process for measuring a surface's bidirectional reflectance rapidly, completely, and accurately. Requiring only two cameras, a light source, and a test sample of known shape, our method generates densely spaced samples covering a large domain of illumination and reflection directions. We verified our measurements both by tests of internal consistency and by comparison against measurements made with a gonioreflectometer. The resulting data show accuracy rivaling that of custom-built dedicated instruments. (C) 2000 Optical Society of America OCIS codes: 290.5820, 120.5820, 160.4760, 290.5880, 110.2960.

引用

页码：2592 / 2600

页数：9

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