Bandgap engineering in Si1-xCx by substitutional doping: First-principle calculations

被引:1
作者
Wang, Yulong [1 ]
Duan, Baoxing [1 ]
Yang, Yintang [1 ]
机构
[1] Xidian Univ, Sch Microelect, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
来源
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 2020年 / 34卷 / 31期
关键词
Ab initio calculations; bandgap engineering; power semiconductor device; ELECTRONIC-PROPERTIES;
D O I
10.1142/S0217979220503063
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this paper, a novel approach is presented for the first time to increase the energy gap of Si-based material by doping carbon atoms into Si-based material structures. The structural electronic properties and mechanical properties of Si1-xCx (x = 0.05, 0.1, 0.15, 0.2, 0.25, 0.3, 0.35, 0.4) are investigated using a first-principles calculation method. Bandgaps of the Si1-xCx shells were found to have, respectively, quadratic relationships with the Carbon content (x). Meanwhile, the electronic bandgap of Si-based material can be increased by 0.334 eV due to the carbon substitutions. The optimal structure is Si0.7C0.3 and the elastic constants and phono calculations reveal that Si0.7C0.3 is mechanically and dynamically stable. Finally, two different heavy doped Si0.7C0.3 have been investigated and the results indicate that the p-type and n-type doped Si0.7C0.3 do produce shallow levels. This study can be a theoretical guidance to improve the bandgap of Si-based semiconductors. In addition, Si0.7C0.3 show superior bandgap and material properties enabling Si0.7C0.3 power device operation at higher temperatures, voltages than current Si-based power semiconductor device.
引用
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页数:8
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