The volume fraction evolution in nanocrystallizing Al-Y-Ni-Fe alloy studied by means of electrical resistivity

被引：1

作者：

Jaskiewicz, P

Pekala, K

Latuch, J

机构：

[1] Warsaw Univ Technol, Inst Phys, PL-02549 Warsaw, Poland

[2] Warsaw Univ Technol, Dept Mat Sci & Engn, PL-02524 Warsaw, Poland

来源：

NANOSTRUCTURED MATERIALS | 1999年 / 11卷 / 06期

关键词：

D O I：

10.1016/S0965-9773(99)00361-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The Al86Y5Ni5Fe4 amorphous and partially nanocrystalline alloys were investigated by means of differential scanning calorimetry (DSC), temperature coefficient of resistivity (TCR) and Transmission Electron Microscopy. The resistivity vs, temperature isochronal relation was used to calculate the transformed volume fraction, x(T), in the first stage of transformation. The comparison between these results and the DSC ones show that the TCR method is more correct far the nanocrystallization process analysis. (C)1999 Acta Metallurgica Inc.

引用

页码：733 / 737

页数：5

共 9 条

[1] Analysis of nanocrystal development in Al-Y-Fe and Al-Sm glasses [J].

Foley, JC ;

Allen, DR ;

Perepezko, JH .

SCRIPTA MATERIALIA, 1996, 35 (05) :655-660

[2] Electron transport properties of Al-Y-Ni metallic glasses [J].

Freitag, JM ;

Altounian, Z .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1997, 226 :1053-1055

[3]

GREER AL, 1998, IN PRESS MAT SCI FOR

[4]

JASKIEWICZ P, 1998, MATER SCI FORUM, V743, P269

[5]

Maxwell J.M., 1954, A Treatise on Electricity & Magnetism, V1

[6] ELECTRICAL RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF SPECULAR REFLECTION AT EXTERNAL SURFACES [J].

MAYADAS, AF ;

SHATZKES, M ;

JANAK, JF .

APPLIED PHYSICS LETTERS, 1969, 14 (11) :345-&

[7]

PEKALA K, 1998, P 5 INT WORKSH NONCR

[8]

ROSSITER PL, 1997, ELECT RESISTIVITY ME

[9]

ZHONG ZC, 1996, 3 INT WORKSH MET PHA

← 1 →