Use of holographic interferometry and electronic speckle pattern interferometry for measurements of dynamic displacements

被引：12

作者：

Caponero, MA

Pasqua, P

Paolozzi, A

Peroni, I

机构：

[1] ENEA, Ctr Ric Frascati, I-00044 Frascati, Italy

[2] Univ Rome La Sapienza, Dept Aerospaziale, I-00184 Rome, Italy

来源：

MECHANICAL SYSTEMS AND SIGNAL PROCESSING | 2000年 / 14卷 / 01期

关键词：

D O I：

10.1006/mssp.1999.1265

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

The paper presents the use of Holographic Interferometry and Electronic Speckle Pattern Interferometry for the measurement of dynamic surface displacements. A concise theoretical background of the optical phenomena on which the two techniques are based is given. Analysis of holographic and speckle fringe patterns due to dynamic displacements is introduced as a generalisation of the case of fringe patterns due to static displacements. Experimental results obtained on a turbine blade, an aluminium panel and a microsatellite sandwich structure are reported. (C) 2000 Academic Press.

引用

页码：49 / 62

页数：14