Stacked PMOS clamps for high voltage power supply protection

被引:29
作者
Maloney, TJ [1 ]
Kan, W [1 ]
机构
[1] Intel Corp, Santa Clara, CA 95052 USA
来源
ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS, 1999 | 1999年
关键词
D O I
10.1109/EOSESD.1999.818992
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Large PMOS FETs with multiple gates can be arranged to provide ESD protection to high voltage on-chip power supplies in submicron integrated circuits. These clamps divide the supply voltage among several gate oxides; the circuitry accompanying the large series FETs provides near-maximum gate drive during the ESD for high pulsed current. Layouts are densely packed because minimum dimensions can be used and because no contact is needed between the stacked gates. The designs for high voltage are extensions of the large PMOS FET ESD clamps and timed drive circuitry that are used to clamp ordinary on-chip power supply lines.
引用
收藏
页码:70 / 77
页数:8
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