The quantitative study of X-ray diffraction dynamics near atomic absorption edge

被引：1
作者：
Zhou, SM
Zhao, ZY
Fukamachi, T
Negishi, R
Yoshizawa, M
Nakajima, T
机构：
[1] SAITAMA INST TECHNOL,OKABE,SAITAMA 36902,JAPAN
[2] KEK,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN
来源：
PHYSICA B | 1996年 / 228卷 / 3-4期
关键词：
X-ray diffraction; absorption edge; GaAs;
D O I：
10.1016/S0921-4526(96)00472-3
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The diffracted and transmitted rocking curves for GaAs 200 reflection in the symmetric Laue case have been measured by the use of synchrotron radiation. The quantitative comparison between the measured curves and the corresponding calculated ones has been carried out near the K-absorption edge of Ga. The measured results agree well with the calculated ones to some extent and the X-ray absorption near edge structure (XANES) can be clearly seen in the rocking curves.
引用
收藏
页码：390 / 396
页数：7
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