Lattice parameter determination by coincidental multi-beam X-ray diffraction

被引：4
|
作者：
Borcha, Mariana [1 ]
Fodchuk, Igor [1 ]
Krytsun, Igor [1 ]
机构：
[1] Chernivtsi Natl Univ, UA-58012 Chernovtsy, Ukraine
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2009年 / 206卷 / 08期
关键词：
MULTIPLE DIFFRACTION; SILICON; STRAIN;
D O I：
10.1002/pssa.200881617
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
High-precision determination of the absolute value of lattice parameter for cubic single crystals is demonstrated by the example of silicon using coincidental multi-beam X-ray diffraction realized by superposition of two three-beam reflections at fixed sample temperature. Based on a semi-kinematical approximation of X-ray scattering theory, the algorithm for calculation of multi-beam diffractograms is developed enabling a more thorough quantitative analysis of experimental results. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码：1699 / 1703
页数：5
相关论文
共 50 条
  • [1] X-RAY RESONANCE MULTI-BEAM DIFFRACTION: EXPERIMENTS AND THE PERTURBATIVE BETHE APPROXIMATION
    Stetsko, Y. P.
    Lin, G. Y.
    Huang, Y. S.
    Chao, C. H.
    Lee, Y. R.
    Chang, S. -L.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C370 - C370
  • [2] Adaptive multi-beam X-ray ptychography
    Astrand, Mattias
    Kahnt, Maik
    Johansson, Ulf
    Vogt, Ulrich
    OPTICS EXPRESS, 2024, 32 (13): : 22771 - 22780
  • [3] Multi-beam X-ray ptychography for high-throughput coherent diffraction imaging
    Yao, Yudong
    Jiang, Yi
    Klug, Jeffrey A.
    Wojcik, Michael
    Maxey, Evan R.
    Sirica, Nicholas S.
    Roehrig, Christian
    Cai, Zhonghou
    Vogt, Stefan
    Lai, Barry
    Deng, Junjing
    SCIENTIFIC REPORTS, 2020, 10 (01)
  • [4] Multi-beam X-ray ptychography for high-throughput coherent diffraction imaging
    Yudong Yao
    Yi Jiang
    Jeffrey A. Klug
    Michael Wojcik
    Evan R. Maxey
    Nicholas S. Sirica
    Christian Roehrig
    Zhonghou Cai
    Stefan Vogt
    Barry Lai
    Junjing Deng
    Scientific Reports, 10
  • [5] HIGH RESOLUTION X-RAY MULTI-BEAM DIFFRACTION STUDIES OF THIN FILM AND INTERFACES
    Kovalchuk, M. V.
    Samoilova, L.
    Kreines, A.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 500 - 500
  • [6] X-RAY STANDING WAVE METHOD UNDER MULTI-BEAM DIFFRACTION CONDITION.
    Kovalchuk, M. V.
    Samoilova, L.
    Kreines, A.
    Zozulja, A.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 531 - 531
  • [7] Multi-beam multi-slice X-ray ptychography
    Astrand, Mattias
    Vogt, Ulrich
    Yang, Runqing
    Perez, Pablo Villanueva
    Li, Tang
    Lyubomirskiy, Mikhail
    Kahnt, Maik
    SCIENTIFIC REPORTS, 2025, 15 (01):
  • [8] PHASE DETERMINATION FROM OVERLAPPED THREE-BEAM DIFFRACTION PROFILES OF MACROMOLECULAR CRYSTALS BY X-RAY STEREOSCOPIC MULTI-BEAM IMAGING
    Chang, S. -L.
    Chao, C. H.
    Hung, C. Y.
    Huang, Y. S.
    Ching, C. H.
    Lee, Y. R.
    Lai, S. C.
    Stetsko, Y. P.
    Yuan, H.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C370 - C370
  • [9] X-ray multi-beam diffraction and imaging at a 90° Bragg reflection with partially coherent radiation
    Nikulin, AY
    Souvorov, A
    Goodden, K
    Tamasaku, K
    Ishikawa, T
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2003, 36 (10A) : A87 - A92
  • [10] Tomosynthesis reconstruction from multi-beam X-ray sources
    Lalush, David S.
    Quan, Enzhuo
    Rajaram, Ramya
    Zhang, Jian
    Lu, Jianping
    Zhou, Otto
    2006 3RD IEEE INTERNATIONAL SYMPOSIUM ON BIOMEDICAL IMAGING: MACRO TO NANO, VOLS 1-3, 2006, : 1180 - +
12345