Real-time control of the beam attenuation with XPAD hybrid pixel detector

被引:14
作者
Dawiec, A. [1 ]
Garreau, Y. [2 ]
Bisou, J. [1 ]
Hustache, S. [1 ]
Kanoute, B. [1 ]
Picca, F. [1 ]
Renaud, G. [1 ]
Coati, A. [1 ]
机构
[1] SOLEIL Synchrotron, Orme Merisiers, St Aubin BP 48, F-91190 Gif Sur Yvette, France
[2] Univ Paris Diderot, UMR CNRS 7162, Sorbonne Paris Cite, MPQ, Batiment Condorcet,Case 7021, F-75205 Paris 13, France
关键词
Detector control systems (detector and experiment monitoring and slow-control systems; architecture; hardware; algorithms; databases); X-ray detectors; X-ray diffraction detectors;
D O I
10.1088/1748-0221/11/12/P12018
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In order to fully benefit from a beam produced by modern synchrotron light sources, characterised by a wide and continuous energy spectrum, high brightness and a very high intensity, advancement in detector technology has been made over the last decades. However, one of the main limitations of the state-of-the-art counting hybrid pixel detectors is the maximum count-rate that is very often few orders of magnitudes lower than of the incident, reflected or diffracted beam flux. Therefore, direct beam attenuation is mandatory in order to perform the measurements according to the detector's characteristics. In this work we present a major upgrade of a fast attenuation system developed at Synchrotron SOLEIL, which allows for a dynamical change of the beam attenuation as a function of the photon flux received by XPAD S140 photon counting detector. The system performs a cyclic real-time estimation of the flux received by every pixel during acquisition of an image and searches for clusters of at least two pixels that exceed user defined levels of counts/ s. The beam attenuation is immediately and automatically changed in order to guarantee that the detector will always operate in its linear range even during a long continuous scan, by acting on the direct attenuators.
引用
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页数:11
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