Phase-sensitive narrowband heterodyne holography

被引:1
作者
Bruno, Francois [1 ]
Laudereau, Jean-Baptiste [1 ]
Lesaffre, Max [1 ]
Verrier, Nicolas [1 ]
Atlan, Michael [1 ]
机构
[1] Univ Paris 07, Univ Paris 06, Fdn Pierre Gilles Gennes,UMR 7587,U 979, CNRS,INSERM,Ecole Super Phys & Chim Ind,Inst Lang, F-75005 Paris, France
关键词
SPECKLE PATTERN INTERFEROMETRY; DIGITAL HOLOGRAPHY; LOCAL OSCILLATOR; AMPLITUDE; VIBRATIONS; WAVES; DISPLACEMENTS; VIBROMETRY; DEVICES; SENSOR;
D O I
10.1364/AO.53.001252
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report on amplitude and phase imaging of out-of-plane sinusoidal surface vibration at nanometer scales with a heterodyne holographic interferometer. The originality of the proposed method is to make use of a multiplexed local oscillator to address several optical sidebands into the temporal bandwidth of a sensor array. This process is called coherent frequency-division multiplexing. It enables simultaneous recording and pixel-to-pixel division of sideband holograms, which permits quantitative wide-field mapping of optical phase-modulation depths. Additionally, a linear frequency chirp ensures the retrieval of the local mechanical phase shift of the vibration with respect to the excitation signal. The proposed approach is validated by quantitative motion characterization of the lamellophone of a musical box, behaving as a group of harmonic oscillators, under weak sinusoidal excitation. Images of the vibration amplitude versus excitation frequency show the resonance of the nanometric flexural response of one individual cantilever, at which a phase hop is measured. (C) 2014 Optical Society of America
引用
收藏
页码:1252 / 1257
页数:6
相关论文
共 34 条
[11]   Full-field vibrometry with digital Fresnel holography [J].
Leval, J ;
Picart, P ;
Boileau, JP ;
Pascal, JC .
APPLIED OPTICS, 2005, 44 (27) :5763-5772
[12]   MECHANICAL VIBRATIONS - MAPPING THEIR PHASE WITH HOLOGRAM INTERFEROMETRY [J].
LEVITT, JA ;
STETSON, KA .
APPLIED OPTICS, 1976, 15 (01) :195-199
[13]   VIBRATION PHASE MAPPING USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY [J].
LOKBERG, OJ ;
HOGMOEN, K .
APPLIED OPTICS, 1976, 15 (11) :2701-2704
[14]   HETERODYNE INTERFEROMETRIC LASER PROBE TO MEASURE CONTINUOUS ULTRASONIC DISPLACEMENTS [J].
MONCHALIN, JP .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (04) :543-546
[15]   Widefield heterodyne interferometry using a custom CMOS modulated light camera [J].
Patel, Rikesh ;
Achamfuo-Yeboah, Samuel ;
Light, Roger ;
Clark, Matt .
OPTICS EXPRESS, 2011, 19 (24) :24546-24556
[16]   Investigation of angular multiplexing and de-multiplexing of digital holograms recorded in microscope configuration [J].
Paturzo, M. ;
Memmolo, P. ;
Tulino, A. ;
Finizio, A. ;
Ferraro, P. .
OPTICS EXPRESS, 2009, 17 (11) :8709-8718
[17]   High-speed digital holographic interferometry for vibration measurement [J].
Pedrini, Giancarlo ;
Osten, Wolfgang ;
Gusev, Mikhail E. .
APPLIED OPTICS, 2006, 45 (15) :3456-3462
[18]   Very high speed cw digital holographic interferometry [J].
Perez-Lopez, Carlos ;
De la Torre-Ibarra, Manuel H. ;
Santoyo, Fernando Mendoza .
OPTICS EXPRESS, 2006, 14 (21) :9709-9715
[19]   3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope [J].
Petitgrand, S ;
Yahiaoui, R ;
Danaie, K ;
Bosseboeuf, A ;
Gilles, JP .
OPTICS AND LASERS IN ENGINEERING, 2001, 36 (02) :77-101
[20]   Time-averaged digital holography [J].
Picart, P ;
Leval, J ;
Mounier, D ;
Gougeon, S .
OPTICS LETTERS, 2003, 28 (20) :1900-1902