共 11 条
- [1] ALKHAZOV GD, 1970, SOV PHYS TECH PHYS-U, V15, P66
- [2] DAYASHANKAR, 1992, RADIAT PHYS CHEM, V40, P523
- [3] AMPLIFICATION AND NOISE IN HIGH-PRESSURE SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF MICROSCOPY-OXFORD, 1993, 169 : 33 - 51
- [4] PRIMARY CONSIDERATIONS FOR IMAGE-ENHANCEMENT IN HIGH-PRESSURE SCANNING ELECTRON-MICROSCOPY .1. ELECTRON-BEAM SCATTERING AND CONTRAST [J]. JOURNAL OF MICROSCOPY-OXFORD, 1990, 158 : 379 - 388
- [5] PRIMARY CONSIDERATIONS FOR IMAGE-ENHANCEMENT IN HIGH-PRESSURE SCANNING ELECTRON-MICROSCOPY .2. IMAGE-CONTRAST [J]. JOURNAL OF MICROSCOPY-OXFORD, 1990, 158 : 389 - 401
- [6] A MODEL FOR CALCULATING SECONDARY AND BACKSCATTERED ELECTRON YIELDS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1987, 147 : 51 - 64
- [8] SHAH JS, 1992, P 10 EUR C EL MICR G
- [9] THIEL BL, 1997, J MICROSC 3, V187
- [10] Von Engel A, 1965, Ionized Gases