Thermal cycling aging effects on the tensile property of lead-free solder Sn-3Ag-0.5Cu

被引:0
作者
Chen, Bingjie [1 ]
Wang, Kaimin [1 ]
Yao, Yao [1 ]
机构
[1] Northwestern Polytech Univ, Sch Mech Civil Engn & Architecture, Xian, Shaanxi, Peoples R China
来源
2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT) | 2017年
关键词
lead-free solder; thermal cycling; Sn-3Ag-0.5Cu; CONSTITUTIVE MODEL; BEHAVIOR; CREEP;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Structural reliability issues attract more and more attentions with the rapid development of electronic packaging industry. Sn-Ag-Cu alloys have long been used as solder materials for the interconnections of microelectronic devices because of low melting temperature and good wettability. Many tensile tests were performed on Sn-3Ag-0.5Cu solder alloys at various strain rates and over a wide temperature range [I]. And thermal cycling aging studies on a lead-free Sn-Ag-Cu solder joint were investigated [2]. In this study, a series of tensile tests of Sn-3Ag-0.5Cu were investigated at different number of cycles and different temperatures. The possible mechanism of tensile strength, ductility improvement were discussed. The samples were placed in liquid nitrogen environment at 77 K for 10 minutes and then 293K(398K) for 10 minutes as one thermal cycle. The number of cycles is 5, 15, 25 and 35. Thermal cycling induces changes in properties.
引用
收藏
页码:708 / 711
页数:4
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