ELECTROMAGNETIC COMPATIBILITY IN INTEGRATED CIRCUITS: A REVIEW

被引：0

作者：

Koselj, Jure ^{[1
]}

Strle, Drago ^{[2
]}

机构：

[1] Kolektor Nanotesla Inst, Ljubljana 1521, Slovenia

[2] Univ Ljubljana, Fac Elect Engn, Ljubljana, Slovenia

来源：

INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS | 2009年 / 39卷 / 01期

关键词：

electromagnetic compatibility; electromagnetic interference; measurement methods; measurement setup; SUSCEPTIBILITY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Electromagnetic compatibility (EMC) studies the unintentional generation, propagation and reception of electromagnetic energy with reference to the unwanted effects. Its goal is to avoid any interference between different equipment, which uses electromagnetic phenomena, in the same electromagnetic environment. This paper is focused on EMC of integrated circuits (ICs) and presents a review of EMC history, IEC standards for EMC in ICs, measurement methods and measurement setups.

引用

页码：16 / 21

页数：6

共 20 条

[1]

[Anonymous], 62132 IEC

[2]

[Anonymous], 61967 IEC

[3]

[Anonymous], ELECTRONICS

[4]

BAKOGLU H, 1990, READING