共 14 条
- [1] Adachi, 1999, OPTICAL CONSTANTS CR, P18
- [2] Electrical properties of polycrystalline Si1-xGex thin-films prepared by a solid-phase crystallization method [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2003, 42 (11A): : L1308 - L1311
- [3] Busch G., 1960, HELV PHYS ACTA, V33, P437
- [4] Microcrystalline silicon-germanium alloys for absorption layers in thin film solar cells [J]. AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998, 1998, 507 : 813 - 818
- [7] MOBILITY OF ELECTRONS IN GERMANIUM-SILICON ALLOYS [J]. PHYSICAL REVIEW, 1958, 111 (01): : 125 - 128
- [8] INTERFERENCE-FREE DETERMINATION OF THE OPTICAL-ABSORPTION COEFFICIENT AND THE OPTICAL GAP OF AMORPHOUS-SILICON THIN-FILMS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (05): : 1008 - 1014