Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

被引：27

作者：

Kageshima, M

Jensenius, H

Dienwiebel, M

Nakayama, Y

Tokumoto, H

Jarvis, SP

Oosterkamp, TH

机构：

[1] Joint Res Ctr Atom Technol, Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058562, Japan

[2] Leiden Univ, Leiden Inst Phys, NL-2333 CA Leiden, Netherlands

[3] Univ Osaka Prefecture, Dept Phys & Elect, Sakai, Osaka 5998531, Japan

来源：

APPLIED SURFACE SCIENCE | 2002年 / 188卷 / 3-4期

关键词：

noncontact atomic force microscopy (NC-AFM); carbon nanotube (CNT); tuning fork; solvation shell; octamethylcyclotetrasiloxane (OMCTS);

D O I：

10.1016/S0169-4332(01)00975-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A force sensor for noncontact atomic force microscopy in liquid environment was developed by combining a multiwalled carbon nanotube (MWNT) probe with a quartz tuning fork. Solvation shells of octamethylcyclotetrasiloxane surface were detected both in the frequency shift and dissipation. Due to the high aspect ratio of the CNT probe, the long-range background force was barely detectable in the solvation region. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

收藏

页码：440 / 444

页数：5

相关论文

共 15 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].

ALBRECHT, TR ;

GRUTTER, P ;

HORNE, D ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673

[2] RESONANCE RESPONSE OF SCANNING FORCE MICROSCOPY CANTILEVERS [J].

CHEN, GY ;

WARMACK, RJ ;

THUNDAT, T ;

ALLISON, DP ;

HUANG, A .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (08) :2532-2537

[3] Atomic force microscopy of single-walled carbon nanotubes using carbon nanotube tip [J].

Choi, N ;

Uchihashi, T ;

Nishijima, H ;

Ishida, T ;

Mizutani, W ;

Akita, S ;

Nakayama, Y ;

Ishikawa, M ;

Tokumoto, H .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6B) :3707-3710

[4]

Durig U, 1997, J APPL PHYS, V82, P3641, DOI 10.1063/1.365726

[5] Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork [J].

Giessibl, FJ .

APPLIED PHYSICS LETTERS, 2000, 76 (11) :1470-1472

[6] Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy [J].

Giessibl, FJ ;

Bielefeldt, H ;

Hembacher, S ;

Mannhart, J .

APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :352-357

[7] DAMPING CHARACTERISTICS OF BEAM-SHAPED MICRO-OSCILLATORS [J].

HOSAKA, H ;

ITAO, K ;

KURODA, S .

SENSORS AND ACTUATORS A-PHYSICAL, 1995, 49 (1-2) :87-95

[8]

Israelachvili J., 1985, Intermolecular and Surface Forces

[9] Frequency modulation detection atomic force microscopy in the liquid environment [J].

Jarvis, S. P. ;

Ishida, T. ;

Uchihashi, T. ;

Nakayama, Y. ;

Tokumoto, H. .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 72 (Suppl 1) :S129-S132

[10] Local solvation shell measurement in water using a carbon nanotube probe [J].

Jarvis, SP ;

Uchihashi, T ;

Ishida, T ;

Tokumoto, H ;

Nakayama, Y .

JOURNAL OF PHYSICAL CHEMISTRY B, 2000, 104 (26) :6091-6094