X-Gen: A random test-case generator for systems and SOCS

被引：34

作者：

Emek, R ^{[1
]}

Jaeger, I ^{[1
]}

Naveh, Y ^{[1
]}

Bergman, G ^{[1
]}

Aloni, G ^{[1
]}

Katz, Y ^{[1
]}

Farkash, M ^{[1
]}

Dozoretz, I ^{[1
]}

Goldin, A ^{[1
]}

机构：

[1] IBM Corp, Res Lab, Haifa, Israel

来源：

SEVENTH IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGS | 2002年

关键词：

Assembly systems; Concrete; Engines; Graphical user interfaces; Hardware; Heart; Laboratories; Registers; System testing; System-on-a-chip;

D O I：

10.1109/HLDVT.2002.1224444

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

We present X-Gen, a model-based test-case generator designed for systems and systems on a chip (SoCs). X-Gen provides a framework and a set of building blocks for system-level test-case generation. At the core of this framework lies a system model, which consists of component types, their configuration, and the interactions between them. Building blocks include commonly used concepts such as memories, registers, and address translation mechanisms. Once a system is modeled, X-Gen provides a rich language for describing test cases. Through this language, users can specify requests that cover the full spectrum between highly directed tests to completely random ones. X-Gen is currently in preliminary use at IBM for the verification of two different designs-a,high-end multi-processor server and a state-of-the-art SoC.

引用

页码：145 / 150

页数：6

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