carbon nanotube (CNT);
depletion mode;
electric-field simulation;
electron emission;
field emission display (FED);
pixel response time;
D O I:
10.1109/TNANO.2004.834158
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
The device level simulation analysis without considering nanometer geometry of the emissive material is carried out on a self-aligned gated field emission triode structure that can be used for low electric-field emissive materials such as carbon nanotubes. The electric properties of the device, such as electric-field distribution, pixel capacitance, and gate controllability, are simulated using a commercially available field solver based on the boundary-element method. The simulation results show that the depletion-mode operation can eliminate high electric field near the triple-junction regions and produce better uniform emission, comparing enhanced mode operation. The detail of the depletion mode operation is discussed. We also calculate the effect of the gate thickness on pixel emission current and suggest control of the variation of gate layer depostion within 3% in short distance and 20%-30% over the whole display area.
机构:
Korea Electrotechnol Res Inst, Appl Imaging Res Grp, Ansan 426901, South KoreaKorea Electrotechnol Res Inst, Appl Imaging Res Grp, Ansan 426901, South Korea
Chang, Won Suk
Choi, Hae Young
论文数: 0引用数: 0
h-index: 0
机构:
Korea Electrotechnol Res Inst, Appl Imaging Res Grp, Ansan 426901, South KoreaKorea Electrotechnol Res Inst, Appl Imaging Res Grp, Ansan 426901, South Korea
Choi, Hae Young
Kim, Jong Uk
论文数: 0引用数: 0
h-index: 0
机构:
Korea Electrotechnol Res Inst, Appl Imaging Res Grp, Ansan 426901, South KoreaKorea Electrotechnol Res Inst, Appl Imaging Res Grp, Ansan 426901, South Korea
Kim, Jong Uk
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS,
2006,
45
(9A):
: 7175
-
7180
机构:
NEC Corp Ltd, Silicon Syst Res Labs, Syst Devices & Fundamental Res, Kanagawa, JapanNEC Corp Ltd, Silicon Syst Res Labs, Syst Devices & Fundamental Res, Kanagawa, Japan
Ito, F
Tomihari, Y
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Silicon Syst Res Labs, Syst Devices & Fundamental Res, Kanagawa, JapanNEC Corp Ltd, Silicon Syst Res Labs, Syst Devices & Fundamental Res, Kanagawa, Japan
Tomihari, Y
Okada, Y
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Silicon Syst Res Labs, Syst Devices & Fundamental Res, Kanagawa, JapanNEC Corp Ltd, Silicon Syst Res Labs, Syst Devices & Fundamental Res, Kanagawa, Japan
Okada, Y
Konuma, K
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Silicon Syst Res Labs, Syst Devices & Fundamental Res, Kanagawa, JapanNEC Corp Ltd, Silicon Syst Res Labs, Syst Devices & Fundamental Res, Kanagawa, Japan
Konuma, K
Okamoto, A
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Silicon Syst Res Labs, Syst Devices & Fundamental Res, Kanagawa, JapanNEC Corp Ltd, Silicon Syst Res Labs, Syst Devices & Fundamental Res, Kanagawa, Japan
机构:
Savitribai Phule Pune Univ, Dept Phys, Pune 411007, Maharashtra, India
Univ S Florida, Dept Phys, Tampa, FL 33620 USASavitribai Phule Pune Univ, Dept Phys, Pune 411007, Maharashtra, India
Kolekar, Sadhu
Patole, S. P.
论文数: 0引用数: 0
h-index: 0
机构:
Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
King Abdullah Univ Sci & Technol, Dept Mat Sci & Engn, Thuwal 239556900, Saudi ArabiaSavitribai Phule Pune Univ, Dept Phys, Pune 411007, Maharashtra, India
Patole, S. P.
Patil, Sumati
论文数: 0引用数: 0
h-index: 0
机构:
Savitribai Phule Pune Univ, Dept Phys, Pune 411007, Maharashtra, India
Indian Inst Sci, Bangalore 560012, Karnataka, IndiaSavitribai Phule Pune Univ, Dept Phys, Pune 411007, Maharashtra, India
Patil, Sumati
Yoo, J. B.
论文数: 0引用数: 0
h-index: 0
机构:
Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South KoreaSavitribai Phule Pune Univ, Dept Phys, Pune 411007, Maharashtra, India
Yoo, J. B.
Dharmadhikari, C. V.
论文数: 0引用数: 0
h-index: 0
机构:
Savitribai Phule Pune Univ, Dept Phys, Pune 411007, Maharashtra, India
Indian Inst Sci Educ & Res, Pune 411008, Maharashtra, IndiaSavitribai Phule Pune Univ, Dept Phys, Pune 411007, Maharashtra, India