Experimental and finite element analysis of the shear speed effects on the Sn-Ag and Sn-Ag-CuBGA solder joints

被引:76
作者
Kim, JW [1 ]
Jung, SB [1 ]
机构
[1] Sungkyunkwan Univ, Dept Adv Mat Engn, Suwon 440746, South Korea
来源
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2004年 / 371卷 / 1-2期
关键词
shear test; BGA; Sn-3.5Ag; Sn-3.5Ag-0.75Cu; solder; finite element analysis;
D O I
10.1016/j.msea.2003.12.012
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
An experimental investigation was combined with a non-linear finite element analysis using an elastic-viscoplastic constitutive model to study the effect of ball shear speed on the shear forces of BGA solder joints. Two solder compositions were examined in this work: Sn-3.5Ag and Sn-3.5A.-0.75Cu. The Cu substrates had been surface finished electrolytically with a 7 mum thick Ni diffusion barrier followed by an 0.5 mum thick An layer to enhance solderability. Ag3Sn and a few AuSn4 intermetallic compound (IMC) particles were found inside the two solders. Only a continuous Ni3Sn4 layer was observed at the interface between the Au/Ni plated layer and the Sn-3.5Ag, while a continuous (Ni1-xCux)(3)Sn-4 layer and a small amount of discontinuous (Cu1-y-Ni-y)(6)Sn-5 particles were formed at the interface between the substrate and the Sn-3.5Ag-0.75Cu. The IMC was identified using energy dispersive spectrometer (EDS) and electron probe micro analysis (EPMA). Shear tests were carried out over a shear speed range from 10 to 700 mum/s at a shear ram height of 50 mum. The shear force was observed to linearly increase with shear speed and reach a maximum value at the highest shear speed in both the experimental and the computational results. All test specimens fractured in a ductile mode. The failure mechanisms were discussed in terms of von Mises stresses and plastic strain energy density distributions. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:267 / 276
页数:10
相关论文
共 28 条
[1]   Characterization of chip scale packaging materials [J].
Amagai, M .
MICROELECTRONICS RELIABILITY, 1999, 39 (09) :1365-1377
[2]   CONSTITUTIVE-EQUATIONS FOR THE RATE-DEPENDENT DEFORMATION OF METALS AT ELEVATED-TEMPERATURES [J].
ANAND, L .
JOURNAL OF ENGINEERING MATERIALS AND TECHNOLOGY-TRANSACTIONS OF THE ASME, 1982, 104 (01) :12-17
[3]  
Anand L., 1985, International Journal of Plasticity, V1, P213, DOI 10.1016/0749-6419(85)90004-X
[4]  
*ASTM, 1991, 126989 ASTM
[5]   Viscoplastic Anand model for solder alloys and its application [J].
Cheng, ZN ;
Wang, GZ ;
Chen, L ;
Wilde, J ;
Becker, K .
SOLDERING & SURFACE MOUNT TECHNOLOGY, 2000, 12 (02) :31-36
[6]  
Dieter G.M., 1988, MECH METALLURGY, P139
[7]  
Erickson J, 1999, DR DOBBS J, V24, P16
[8]  
GILLEO K, 2002, AREA ARRAY PACKAGING
[9]   Experimental investigation on the progressive failure mechanism of solder balls during ball shear test [J].
Huang, XJ ;
Lee, SWR ;
Yan, CC .
52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS, 2002, :968-973
[10]  
HUNG SC, 1999, P 24 IEEE CPMT INT E, P7