Present developments in high-resolution transmission electron microscopy

被引：13
作者：
Ernst, F
Ruhle, M
机构：
[1] Max-Planck-Inst. fur Metallforschung, Seestraße 92, 70174, Stuttgart
来源：
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE | 1997年 / 2卷 / 04期
关键词：
D O I：
10.1016/S1359-0286(97)80092-7
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
High-resolution transmission electron microscopy (HRTEM) now approaches a resolution of 1 Angstrom, combining recent instrumental developments with innovative strategies of imaging and image processing. Moreover, HRTEM has become a truly 'quantitative' technique that enables one to retrieve the atomistic structure of materials with high and well-known reliability. At the same time, HRTEM has found new applications: plan-view imaging of the atom configuration at reconstructed crystal surfaces; and atomistic in situ observation of diffusion reactions and defect kinetics in solids.
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收藏
页码：469 / 476
页数：8
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