Random telegraph signals in charge coupled devices

被引：28

作者：

Smith, DR ^{[1
]}

Holland, AD ^{[1
]}

Hutchinson, IB ^{[1
]}

机构：

[1] Brunel Univ, Dept Elect & Comp Engn, Uxbridge UB8 3PH, Middx, England

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2004年 / 530卷 / 03期

关键词：

random telegraph signal; CCD; charge coupled device; radiation damage;

D O I：

10.1016/j.nima.2004.03.210

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An investigation of fluctuating pixels resulting from proton irradiation of an E2V Technologies CCD47-20 device is presented. The device structure, experimental set up and irradiation methodology are described, followed by a detailed analysis of radiation induced random telegraph signals, RTS. The characteristics of the observed flickering pixels are discussed in detail and the proposed models explaining the mechanism behind the phenomena are viewed in light of the collected data. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：521 / 535

页数：15

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