Real-Time Optical Frequency-Domain Reflectometry

被引:0
|
作者
Park, Y. [1 ]
Ahn, T. -J. [1 ]
Kieffer, J. -C. [1 ]
Azana, J. [1 ]
机构
[1] INRS, Montreal, PQ H5A 1K6, Canada
关键词
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We propose and demonstrate an ultrafast optical frequency domain reflectometry system based on real-time optical Fourier-transformation. Interferograms are captured over 50 ns time windows at a 20 MHz repetition rate with a 70 mu m depth resolution. (C) 2007 Optical Society of America
引用
收藏
页码:665 / 666
页数:2
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