Real-Time Optical Frequency-Domain Reflectometry

被引：0
|
作者：
Park, Y. [1 ]
Ahn, T. -J. [1 ]
Kieffer, J. -C. [1 ]
Azana, J. [1 ]
机构：
[1] INRS, Montreal, PQ H5A 1K6, Canada
来源：
2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007), VOLS 1-5 | 2007年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We propose and demonstrate an ultrafast optical frequency domain reflectometry system based on real-time optical Fourier-transformation. Interferograms are captured over 50 ns time windows at a 20 MHz repetition rate with a 70 mu m depth resolution. (C) 2007 Optical Society of America
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收藏
页码：665 / 666
页数：2
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