Dust-induced shading on photovoltaic modules

被引:156
作者
Qasem, Hassan [1 ]
Betts, Thomas R. [1 ]
Muellejans, Harald [2 ]
AlBusairi, Hassan [3 ]
Gottschalg, Ralph [1 ]
机构
[1] Univ Loughborough, Ctr Renewable Energy Syst Technol, Sch Elect Elect & Syst Engn, Loughborough LE11 3TU, Leics, England
[2] European Commiss, Joint Res Ctr, Inst Energy & Transport, Renewable Energy Unit, I-21027 Ispra, VA, Italy
[3] Kuwait Inst Sci Res, Bldg & Energy Technol Dept, Safat 13109, Kuwait
来源
PROGRESS IN PHOTOVOLTAICS | 2014年 / 22卷 / 02期
基金
英国工程与自然科学研究理事会;
关键词
dust; spectral response; amorphous silicon; crystalline silicon; transmittance; soiling ratio; SOLAR COLLECTORS; AIRBORNE DUST; PERFORMANCE; DEPOSITION; CELLS;
D O I
10.1002/pip.2230
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
The effect of dust on photovoltaic modules is investigated with respect to concentration and spectral transmittance. Samples were collected in the form of raw dust as well as accumulated dust on exposed sheets of glass at different tilt angles. Spectral transmittance of the samples was determined. Transmittance variation between top, middle and bottom was identified for samples collected at different inclinations, where the worst case was seen at a tilt angle of 30(o) with a non-uniformity of 4.4% in comparison with 0.2% for the 90 degrees tilt. The measured data showed a decrease in transmittance at wavelengths <570nm. Integrating this with measured spectral responses of different technologies demonstrates that wide band-gap thin-film technologies are affected more than, for example crystalline silicon technologies. The worst case is amorphous silicon, where a 33% reduction in photocurrent is predicted for a dust concentration of 4.25mg/cm(2). Similarly, crystalline silicon and CIGS technologies are predicted to be less affected, with 28.6% and 28.5% reductions in photocurrent, respectively. The same procedure was repeated with varying Air Mass (AM), tilt angle and dust concentration values to produce a soiling ratio table for different technologies under different AM, tilt angle and dust concentration values. Copyright (c) 2012 John Wiley & Sons, Ltd.
引用
收藏
页码:218 / 226
页数:9
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