Soft x-ray detection for small satellites with a commercial CMOS sensor at room temperature

被引:6
作者
Tammes, Steve [1 ]
Roth, Tyler [1 ]
Kaaret, Philip [1 ]
DeRoo, Casey [1 ]
Elmaleh, Abdallah [1 ]
McChesney, Jessica L. [2 ]
Rodolakis, Fanny [2 ]
机构
[1] Univ Iowa, Dept Phys & Astron, Iowa City, IA 52242 USA
[2] Argonne Natl Lab, Argonne, IL 60439 USA
基金
美国国家科学基金会;
关键词
CMOS image sensor; back-side illuminated; x-rays spectroscopy; x-ray imaging; silicon; radiation effects; sensor performance; IMAGING SPECTROMETER; ENERGY;
D O I
10.1117/1.JATIS.6.4.046004
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
Recently, complementary metal-oxide-semiconductor (CMOS) sensors have progressed to a point where they may offer improved performance in imaging x-ray detection compared to the charge-coupled devices often used in x-ray satellites. We demonstrate x-ray detection in the soft x-ray band (250 to 1700 eV) by a commercially available back-illuminated Sony IMX290LLR CMOS sensor using the Advanced Photon Source at Argonne National Laboratory. While operating the device at room temperature, we measure energy resolutions (full width at half maximum) of 48 eVat 250 eVand of 83 eVat 1700 eV, which are comparable to the performance of the "Chandra" ACIS and the "Suzaku" XIS. Furthermore, we demonstrate that the IMX290LLR can withstand radiation up to 17.1 krad, making it suitable for use on spacecraft in low Earth orbit. (C) 2020 Society of Photo-Optical Instrumentation Engineers (SPIE).
引用
收藏
页数:9
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