Monitoring biofilm thickness using a non-destructive, on-line, electrical capacitance technique
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作者:
Mauricio, R.
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Univ Nova Lisboa, Fac Ciencias & Tecnol, Dep Ciencias & Engn Ambiente, P-2829516 Monte De Caparica, PortugalUniv Nova Lisboa, Fac Ciencias & Tecnol, Dep Ciencias & Engn Ambiente, P-2829516 Monte De Caparica, Portugal
Mauricio, R.
[1
]
Dias, C. J.
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机构:Univ Nova Lisboa, Fac Ciencias & Tecnol, Dep Ciencias & Engn Ambiente, P-2829516 Monte De Caparica, Portugal
Dias, C. J.
Santana, F.
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机构:Univ Nova Lisboa, Fac Ciencias & Tecnol, Dep Ciencias & Engn Ambiente, P-2829516 Monte De Caparica, Portugal
Santana, F.
机构:
[1] Univ Nova Lisboa, Fac Ciencias & Tecnol, Dep Ciencias & Engn Ambiente, P-2829516 Monte De Caparica, Portugal
[2] Univ Nova Lisboa, Fac Ciencias & Tecnol, Dept Ciencias Mat, P-2829516 Monte De Caparica, Portugal
The present study was designed to evaluate indirect, non-invasive, on-line measurement of biofilm thickness using an electrical capacitance technique. Several assays were carried out and the results showed that, at a frequency of I kHz, electrical capacitance could be used to measure biofilm thickness indirectly (with a correlation coefficient of 0.9495). The reproducibility revealed by the assays was also highly satisfactory. However, in contrast to what was expected, there was an inverse relationship between electrical capacitance and biofilm thickness, i.e. electrical capacitance diminished with the increase in the biofilm thickness. The tests were also carried out at different frequencies (1 kHz, 10 kHz and 100 kHz).