Spatial Resolution in IR Reflectance Imaging - NIR, Mid-IR, and AIR

被引:0
作者
Sellors, Jerry [1 ]
Spragg, Richard [1 ]
机构
[1] PerkinElmer Seer Green, Beaconsfield, Bucks, England
关键词
D O I
暂无
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
When images are measured in reflectance, the observed structure is not necessarily just that of the sample surface. The two-dimensional (2D) images produced by near-infrared (NIR) and mid-IR imaging are representations of three-dimensional (3D) objects. In reflectance images the effective spatial resolution is affected by how far the radiation penetrates into the sample as well as by diffraction and the pixel size. NIR images are typically. dominated by diffuse reflection with the result that in practice spatial resolution is limited by the penetration depth. Mid-IR reflectance images may contain both specular and diffuse components. These have different spatial resolutions as the specular component shows purely surface structure. In attenuated total reflectance (AIR) images the resolution has a component that depends on the distribution of components within a surface layer corresponding to the penetration depth, which is proportional to wavelength. We illustrate these different contributions to the observed resolution with images of materials with known 2D and 3D structures.
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页码:46 / +
页数:5
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