Positive binding energy of a biexciton confined in a localization center formed in a single InxGa1-xN/GaN quantum disk

被引:40
作者
Bardoux, R. [1 ]
Kaneta, A. [1 ,3 ]
Funato, M. [1 ,3 ]
Kawakami, Y. [1 ,3 ]
Kikuchi, A. [2 ,3 ]
Kishino, K. [2 ,3 ]
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6158510, Japan
[2] Sophia Univ, Dept Elect & Elect Engn, Tokyo 1028554, Japan
[3] Japan Sci & Technol Agcy, CREST, Kawaguchi, Saitama 3300012, Japan
关键词
biexcitons; binding energy; gallium compounds; III-V semiconductors; indium compounds; photoluminescence; radiative lifetimes; semiconductor quantum dots; time resolved spectra; wide band gap semiconductors; FINE-STRUCTURE; EXCITON; DYNAMICS;
D O I
10.1103/PhysRevB.79.155307
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report microphotoluminescence spectroscopy performed on individual and ensemble InGaN/GaN quantum disks (Q-disks). The typical spectrum of a single Q-disk exhibited the contribution of localization centers (LCs) formed in the InGaN active layer of the Q-disks, characterized by sharp lines appearing on the low energy side of the spectra. In addition, a broader emission peak identified as the luminescence of the quasi-two-dimensional (2D) InGaN active layer surrounding the LCs appears systematically at higher energy. Time-resolved photoluminescence experiment performed on single Q-disks exhibited the excitonic transfer, from the 2D InGaN active layer to LCs, at the submicroscopic scale. Excitation power dependence studies and linear polarization analysis allowed us to identify a biexciton complex confined in a LC in a single Q-disk with a surprising positive binding energy of 13 meV. The absence of screening effect by increasing the excitation power density and the fast excitonic radiative lifetime of a few hundred picoseconds that we measured on several individual Q-disks indicate that the absence of internal electric field in the structure can explain the observed positive biexciton binding energy.
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页数:6
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