Carrier lifetime measurements on various crystal faces of rutile TiO2 single crystals

被引：18

作者：

Kato, Masashi ^{[1
]}

Kohama, Kimihiro ^{[1
]}

Ichikawa, Yoshihito ^{[1
]}

Ichimura, Masaya ^{[1
]}

机构：

[1] Nagoya Inst Technol, Dept Engn Phys Elect & Mech, Showa Ku, Nagoya, Aichi 4668555, Japan

来源：

MATERIALS LETTERS | 2015年 / 160卷

关键词：

Rutile TiO2; Carrier lifetime; Crystal face; ELECTRON-HOLE RECOMBINATION; TITANIUM(IV) OXIDE POWDER; ATOMICALLY SMOOTH; WATER; SURFACES; DEPENDENCE;

D O I：

10.1016/j.matlet.2015.08.018

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Carrier lifetimes in rutile TiO2 single crystals were measured by the microwave photoconductivity decay method. The measurement results showed that carrier lifetimes in rutile TiO2 single crystals were dominated by the surfaces recombination but not recombination centers in the bulk. The surface recombination at the (110) face is the slowest among the crystal faces, and thus photocatalytic activity would be relatively high for a crystal with the (110) face. (C) 2015 Elsevier B.V. All rights reserved.

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收藏

页码：397 / 399

页数：3

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