Characterization of W-type hexaferrite thin films prepared by chemical solution deposition

被引:6
作者
Soroka, Miroslav [1 ,2 ]
Bursik, Josef [1 ]
Kuzel, Radomir [3 ]
Prokleska, Jan [3 ]
Aguirre, Myriam H. [4 ,5 ]
机构
[1] Czech Acad Sci, Vvi, Inst Inorgan Chem, Husinec Rez 25068 1001, Czech Republic
[2] Charles Univ Prague, Fac Sci, Hlavova 2030-8, Prague 12843 2, Czech Republic
[3] Charles Univ Prague, Fac Math & Phys, Ke Karlovu 5, Prague 12116 2, Czech Republic
[4] Univ Zaragoza, Inst Mat Sci Aragon, Dept Phys Condensed Matter, CSIC, Pedro Cerbuna 12, Zaragoza 50009, Spain
[5] Inst Nanosci Aragon, Lab Adv Microscopy, Ed I D,Campus Rio Ebro, Zaragoza 50018, Spain
基金
欧盟地平线“2020”;
关键词
W-type hexaferrites; Thin films; Chemical solution deposition; Spin reorientation transition; HEXAGONAL BARIUM FERRITE; NEUTRON-DIFFRACTION; CRYSTAL-CHEMISTRY; GROWTH; LAYERS; NI;
D O I
10.1016/j.tsf.2021.138670
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films of W-type hexaferrite were grown on SrTiO3(111) single crystals using the chemical solution deposition method and metalorganic precursor solutions prepared using the modified Pechini method. The synthesis of single-phase materials required optimizing the initial stoichiometry and crystallization conditions. The results showed that a concurrent excess of alkaline earth metal and deficiency in divalent metal ion (Zn2+, Co2+) favors the synthesis of pure W hexaferrites. This off-stoichiometry suppressed the formation of an exceedingly stable spinel phase at pyrolysis temperatures. The epitaxial nature of thin films, expressed as the orientation relation (00l)W [[ (111)SrTiO3 and [110]W [[ [112]SrTiO3 and hence the pronounced anisotropy of their magnetic properties as well were established by three dimensional x-ray diffraction texture analysis and magnetization measurements, respectively and enabled to identify the temperature interval in which the characteristic spin reorientation transition occurs for a specific degree of cobalt substitution.
引用
收藏
页数:10
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