Time delay and integration imaging for inspection and profilometry of moving objects

被引:9
作者
Marokkey, SR [1 ]
Tay, CJ [1 ]
Shang, HM [1 ]
Asundi, AK [1 ]
机构
[1] NANYANG TECHNOL UNIV, SCH MECH & PROD ENGN, SINGAPORE 639798, SINGAPORE
关键词
inspection; machine vision; digital imaging; moire; profilometry; dynamic imaging;
D O I
10.1117/1.601497
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Dynamic inspection of moving objects is a significant task in industrial machine vision systems. A CCD camera operating in time delay and integration (TDI) mode is equivalent to a digital drum camera, providing possibilities for dynamic inspection of moving objects (either rotating or translating on industrial platforms). We report some advances in the application of TDI cameras for the inspection and profiling of moving objects, The method is based on conventional light projection systems that are widely used in industry. The TDI system generates an on-line scanning moire display that could assist operators to identify defects on objects such as dents. Conventional projection systems use mechanical or interferometric types of fringe projections, which is not desirable in the industrial environment. The TDI system makes use of temporal modulation of a laser diode, which could be easily controlled by a PC or by the output ports in vision systems. In addition to the details of system implementation, we also describe two algorithms for unwrapping the deformation or shape profile of the test object based on the fast Fourier transform and sinusoidal fitting of the recorded patterns. (C) 1997 Society of Photo-Optical instrumentation Engineers.
引用
收藏
页码:2573 / 2578
页数:6
相关论文
共 12 条
[1]   360-DEG PROFILOMETRY - NEW TECHNIQUES FOR DISPLAY AND ACQUISITION [J].
ASUNDI, AK ;
CHAN, CS ;
SAJAN, MR .
OPTICAL ENGINEERING, 1994, 33 (08) :2760-2769
[2]   Digital drum camera for dynamic recording [J].
Asundi, AK ;
Sajan, MR .
OPTICAL ENGINEERING, 1996, 35 (06) :1707-1713
[3]   DIGITAL WAVEFRONT MEASURING INTERFEROMETER FOR TESTING OPTICAL SURFACES AND LENSES [J].
BRUNING, JH ;
HERRIOTT, DR ;
GALLAGHER, JE ;
ROSENFELD, DP ;
WHITE, AD ;
BRANGACCIO, DJ .
APPLIED OPTICS, 1974, 13 (11) :2693-2703
[4]  
CHAMBERLAIN SG, 1990, PHOTON SPECTRA, V24, P161
[5]   AUTOMATED MEASUREMENT METHOD FOR 360-DEGREES PROFILOMETRY OF 3-D DIFFUSE OBJECTS [J].
CHENG, XX ;
SU, XY ;
GUO, LR .
APPLIED OPTICS, 1991, 30 (10) :1274-1278
[6]  
DAVID LG, 1989, P SOC PHOTO-OPT INS, V1194, P36
[7]  
LAKE D, 1990, ADV IMAG, V5, P48
[8]   Sensitivity-variable moire topography with a phase shift method [J].
Matsumoto, T ;
Kitagawa, Y ;
Minemoto, T .
OPTICAL ENGINEERING, 1996, 35 (06) :1754-1760
[9]  
MICHAEL GF, 1980, IEEE T ELECTRON DEV, V27, P1688
[10]   FOURIER-TRANSFORM PROFILOMETRY FOR THE AUTOMATIC-MEASUREMENT OF 3-D OBJECT SHAPES [J].
TAKEDA, M ;
MUTOH, K .
APPLIED OPTICS, 1983, 22 (24) :3977-3982