Czochralski silicon detectors irradiated with 24GeV/c and 10 MeV protons

被引：14

作者：

Tuovinen, E.

Harkonen, J.

Luukka, P.

Tuominen, E.

Verbitskaya, E.

Eremin, V.

Yashenko, I.

Pirojenko, A.

Riihimaki, I.

Virtanen, A.

Leinonen, K.

机构：

[1] Univ Helsinki, Helsinki Inst Phys, FIN-00014 Helsinki, Finland

[2] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 196140, Russia

[3] Univ Jyvaskyla, Accelerator Lab, SF-40351 Jyvaskyla, Finland

[4] Lappeenranta Univ Technol, Lappeenranta, Finland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2006年 / 568卷 / 01期

基金：

芬兰科学院;

关键词：

silicon detectors; radiation hardness; Czochralski silicon; transient current technique; scanning electron microscope;

D O I：

10.1016/j.nima.2006.05.208

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have irradiated Czochralski silicon (Cz-Si) and Float Zone silicon (Fz-Si) detectors with 24 GeV/c and 10 MeV protons. Samples were characterized with Capacitance-Voltage measurements (CV), Transient Current Technique (TCT) and secondary electron backscattering recorded by Scanning Electron Microscope (SEM). We present the evolution of the effective doping concentration as a function of irradiation fluence as well as the introduction rate of negative space charge, beta-parameter. According to these measurements, we found that Cz-Si is more radiation hard than Fz-Si. Both TCT and SEM measurements indicated that Space Charge Sign Inversion (SCSI) occurred in the heavily irradiated Fz-Si and in the Cz-Si irradiated with 10 MeV protons. However, the SCSI did not take place in Cz-Si irradiated with 24 GeV/c protons even after high irradiation fluence. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：83 / 88

页数：6

共 20 条

[1]

*CERN, 2003, CERNLHCC2003058, P30

[2]

*CERN LHCC, 1994, 9438 CERNLHCC

[3] Development of transient current and charge techniques for the measurement of effective net concentration of ionized charges (N-eff) in the space charge region of p-n junction detectors [J].

Eremin, V ;

Strokan, N ;

Verbitskaya, E ;

Li, Z .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1996, 372 (03) :388-398

[4]

EREMIN V, 1996, NUCL INSTRUM METH A, V372, P188

[5] Processing of microstrip detectors on Czochralski grown high resistivity silicon substrates [J].

Härkönen, J ;

Tuominen, E ;

Tuovinen, E ;

Mehtälä, P ;

Lassila-Perini, K ;

Ovchinnikov, V ;

Heikkilä, P ;

Yli-Koski, M ;

Palmu, L ;

Kallijärvi, S ;

Nikkilä, H ;

Anttila, O ;

Niinikoski, T ;

Eremin, V ;

Ivanov, A ;

Verbitskaya, E .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2003, 514 (1-3) :173-179

[6]

HARKONEN J, 2004, NUCL SCI S C RECORD, V3, P1999

[7] Simulation of non-ionising energy loss and defect formation in silicon [J].

Huhtinen, M .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2002, 491 (1-2) :194-215

[8] Investigation of voltages and electric fields in silicon radiation detectors using a scanning electron microscope [J].

Leinonen, K .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 555 (1-2) :411-419

[9] Investigation of type inversion of n-bulk in 10 MeV proton-irradiated FZ silicon detectors using a scanning electron microscope [J].

Leinonen, K ;

Palviainen, T ;

Tuuva, T ;

Tuovinen, E ;

Härkönen, J ;

Luukka, P .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 552 (03) :357-363

[10] Radiation hard silicon detectors -: developments by the RD48 (ROSE) collaboration [J].

Lindström, G ;

Ahmed, M ;

Albergo, S ;

Allport, P ;

Anderson, D ;

Andricek, L ;

Angarano, MM ;

Augelli, V ;

Bacchetta, N ;

Bartalini, P ;

Bates, R ;

Biggeri, U ;

Bilei, GM ;

Bisello, D ;

Boemi, D ;

Borchi, E ;

Botila, T ;

Brodbeck, TJ ;

Bruzzi, M ;

Budzynski, T ;

Burger, P ;

Campabadal, F ;

Casse, G ;

Catacchini, E ;

Chilingarov, A ;

Ciampolini, P ;

Cindro, V ;

Costa, MJ ;

Creanza, D ;

Clauws, P ;

Da Via, C ;

Davies, G ;

De Boer, W ;

Dell'Orso, R ;

De Palma, M ;

Dezillie, B ;

Eremin, V ;

Evrard, O ;

Fallica, G ;

Fanourakis, G ;

Feick, H ;

Focardi, E ;

Fonseca, L ;

Fretwurst, E ;

Fuster, J ;

Gabathuler, K ;

Glaser, M ;

Grabiec, P ;

Grigoriev, E ;

Hall, G .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 466 (02) :308-326

← 1 2 →